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Microprocessor Aging Analysis and Reliability Modeling Due to Back-End Wearout Mechanisms., and . IEEE Trans. VLSI Syst., 23 (10): 2065-2076 (2015)Accurate standard cell characterization and statistical timing analysis using multivariate adaptive regression splines., , and . ISQED, page 272-279. IEEE, (2015)Size-controllable memory reduction scheme of storing reference frames at H.264/AVC under I, P and B., , and . ICME, page 802-807. IEEE Computer Society, (2010)MBIST and statistical hypothesis test for time dependent dielectric breakdowns due to GOBD vs. BTDDB in an SRAM array., , , and . VTS, page 1-6. IEEE Computer Society, (2015)SRAM stability analysis for different cache configurations due to Bias Temperature Instability and Hot Carrier Injection., , , and . ICCD, page 225-232. IEEE Computer Society, (2016)A Low Cost VLSI Architecture for Spike Sorting Based on Feature Extraction with Peak Search., , and . Sensors, 16 (12): 2084 (2016)Enhancing error resiliency for multi-hypothesis video coding techniques., , and . ICME, page 413-416. IEEE Computer Society, (2008)Estimation of remaining life using embedded SRAM for wearout parameter extraction., , , , and . IWASI, page 243-248. IEEE, (2015)Construct the Activity Policies of Collaborative Product Design Using the Maturity Level 2 of CMMI., , and . Int. J. Electron. Bus. Manag., 3 (1): 41-57 (2005)Comprehensive reliability and aging analysis on SRAMs within microprocessor systems., , , and . Microelectronics Reliability, 55 (9-10): 1290-1296 (2015)