Author of the publication

Dynamic effects in the detection of bridging faults in CMOS ICs.

, , and . J. Electronic Testing, 3 (3): 197-205 (1992)

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed. You can also use the button next to the name to display some publications already assigned to the person.

 

Other publications of authors with the same name

Modeling of SET seasoning effects in Phase Change Memory arrays., , and . Microelectronics Reliability, 52 (6): 1060-1064 (2012)Reliability of erasing operation in NOR-Flash memories., and . Microelectronics Reliability, 45 (7-8): 1094-1108 (2005)SSDExplorer: A Virtual Platform for Performance/Reliability-Oriented Fine-Grained Design Space Exploration of Solid State Drives., , , , , , , and . IEEE Trans. on CAD of Integrated Circuits and Systems, 34 (10): 1627-1638 (2015)A Highly Testable 1-out-of-3 CMOS Checker., , , and . DFT, page 279-286. IEEE Computer Society, (1993)System interconnect extensions for fully transparent demand paging in low-cost MMU-less embedded systems., , , , and . ISSoC, page 1-6. IEEE, (2013)Detection of PLA multiple crosspoint faults., , , and . EURO-DAC, page 80-84. EEE Computer Society, (1991)Automated characterization of TAS-MRAM test arrays., , , , , , and . DTIS, page 1-2. IEEE, (2015)Reliability evaluation of combinational logic circuits by symbolic simulation., , , and . VTS, page 235-243. IEEE Computer Society, (1995)Experimental Investigation of 4-kb RRAM Arrays Programming Conditions Suitable for TCAM., , , , , , , , and . IEEE Trans. VLSI Syst., 26 (12): 2599-2607 (2018)Reliability of CMOS Integrated Memristive HfO2 Arrays with Respect to Neuromorphic Computing., , , , , , , , and . IRPS, page 1-4. IEEE, (2019)