Author of the publication

Combining Josephson Systems for Spectrally Pure AC Waveforms With Large Amplitudes.

, , , , and . IEEE Trans. Instrumentation and Measurement, 62 (6): 1634-1639 (2013)

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed. You can also use the button next to the name to display some publications already assigned to the person.

 

Other publications of authors with the same name

Combining Josephson Systems for Spectrally Pure AC Waveforms With Large Amplitudes., , , , and . IEEE Trans. Instrumentation and Measurement, 62 (6): 1634-1639 (2013)Quantum Hall Resistance Standards With Good Quantization at High Electron Mobilities., , , , and . IEEE Trans. Instrumentation and Measurement, 60 (7): 2455-2461 (2011)The width of AC quantum Hall plateaus., , , , and . IEEE Trans. Instrumentation and Measurement, 53 (3): 826-829 (2004)The Josephson-Effect-Based Primary AC Power Standard at the PTB: Progress Report., , , , , , and . IEEE Trans. Instrumentation and Measurement, 58 (4): 1049-1053 (2009)Magnetic Field Reversible Serial Quantum Hall Arrays., , , , and . IEEE Trans. Instrumentation and Measurement, 60 (7): 2512-2516 (2011)Settling Behavior of the Bridge Voltage in Resistance Ratio Measurements With Cryogenic Current Comparators., , , and . IEEE Trans. Instrumentation and Measurement, 60 (7): 2660-2666 (2011)Noise and Correlation Study of Quantum Hall Devices., , and . IEEE Trans. Instrumentation and Measurement, 62 (6): 1574-1580 (2013)Loss phenomena in the AC quantum Hall effect., , , , , and . IEEE Trans. Instrumentation and Measurement, 50 (2): 214-217 (2001)First Attempt to Develop an On-Chip Double-Shielded QHR Device for Use in AC Measurements., , , , , and . IEEE Trans. Instrumentation and Measurement, 62 (6): 1743-1748 (2013)Study of the limitations of the quantized acoustic current technique at PTB and NPL., , , , and . IEEE Trans. Instrumentation and Measurement, 52 (2): 594-598 (2003)