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A CMOS analog adaptive BAM with on-chip learning and weight refreshing., , , and . IEEE Trans. Neural Networks, 4 (3): 445-455 (1993)Built-In Self-Test in Mixed-Signal ICs: A DTMF Macrocell., , , and . VLSI Design, page 568-571. IEEE Computer Society, (2000)Self-Timed Boundary-Scan Cells for Multi-Chip Module Test., , , , and . VTS, page 92-97. IEEE Computer Society, (1998)Effective oscillation-based test for application to a DTMF filter bank., , , and . ITC, page 549-555. IEEE Computer Society, (1999)Analog and Mixed-Signal Benchmark Circuits-First Release., , , , , , , and . ITC, page 183-190. IEEE Computer Society, (1997)OBT for settling error test of sampled-data systems using signal-dependent clocking., , and . European Test Symposium, page 1-6. IEEE Computer Society, (2012)Testability in analogue cellular neural networks., and . I. J. Circuit Theory and Applications, 20 (5): 583-587 (1992)Easily Testable PLA-based FSMS., , and . ISCAS, page 1603-1606. IEEE, (1993)A Method for Parameter Extraction of Analog Sine-Wave Signals for Mixed-Signal Built-In-Self-Test Applications., , , , and . DATE, page 298-305. IEEE Computer Society, (2004)Modeling OpAmp-Induced Harmonic Distorition for Switched-Capacitor Sigma-Delta Modulator Design., , , and . ISCAS, page 445-448. IEEE, (1994)