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On the Critical Role of Ferroelectric Thickness for Negative Capacitance Transistor Optimization

O. Prakash, A. Gupta, G. Pahwa, Y. Chauhan, and H. Amrouch. 2021 5th IEEE Electron Devices Technology & Manufacturing Conference (EDTM), Piscataway, IEEE, (2021)
DOI: 10.1109/EDTM50988.2021.9420894

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Dr. -Ing. Hussam Amrouch University of Stuttgart

Other publications of authors with the same name

Accurate Thermal-Profile Estimation and Validation for FPGA-Mapped Circuits.A. Amouri, H. Amrouch, T. Ebi, J. Henkel, and M. Tahoori. FCCM, page 57-60. IEEE Computer Society, (2013)Towards interdependencies of aging mechanisms.H. Amrouch, V. van Santen, T. Ebi, V. Wenzel, and J. Henkel. ICCAD, page 478-485. IEEE, (2014)Lucid infrared thermography of thermally-constrained processors.H. Amrouch, and J. Henkel. ISLPED, page 347-352. IEEE, (2015)Stress balancing to mitigate NBTI effects in register files.H. Amrouch, T. Ebi, and J. Henkel. DSN, page 1-10. IEEE Computer Society, (2013)Reliability in Super- and Near-Threshold Computing: A Unified Model of RTN, BTI, and PV.V. van Santen, J. Martín-Martínez, H. Amrouch, M. Nafría, and J. Henkel. IEEE Trans. on Circuits and Systems, 65-I (1): 293-306 (2018)Dynamic resource management for heterogeneous many-cores.J. Henkel, J. Teich, S. Wildermann, and H. Amrouch. ICCAD, page 60. ACM, (2018)Emerging (un-)reliability based security threats and mitigations for embedded systems: special session.H. Amrouch, P. Krishnamurthy, N. Patel, J. Henkel, R. Karri, and F. Khorrami. CASES, page 17:1-17:10. ACM, (2017)GNN4REL : Graph Neural Networks for Predicting Circuit Reliability DegradationL. Alrahis, J. Knechtel, F. Klemme, H. Amrouch, and O. Sinanoglu. 41, 11, page 3826-3837. IEEE, (2022)Binarized SNNs : Efficient and Error-Resilient Spiking Neural Networks through BinarizationM. Wei, M. Yayla, S. Ho, C. Yang, J. Chen, and H. Amrouch. 2021 IEEE/ACM International Conference On Computer Aided Design (ICCAD), Piscataway, IEEE, (2021)MLCAD: A Survey of Research in Machine Learning for CAD Keynote PaperM. Rapp, H. Amrouch, Y. Lin, B. Yu, D. Pan, M. Wolf, and J. Henkel. IEEE transactions on computer-aided design of integrated circuits and systems, (2021)

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On the Critical Role of Ferroelectric Thickness for Negative Capacitance Transistor Optimization

Please choose a person to relate this publication to

Dr. -Ing. Hussam Amrouch University of Stuttgart

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copydeleteadd this publication to your clipboardcommunity posthistory of this postURLDOIBibTeXEndNoteAPAChicagoDIN 1505HarvardMSOffice XML On the Critical Role of Ferroelectric Thickness for Negative Capacitance Transistor Optimization

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Dr. -Ing. Hussam Amrouch University of Stuttgart

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On the Critical Role of Ferroelectric Thickness for Negative Capacitance Transistor Optimization