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Phase noise measurement on IF analog signals using standard digital ATE resources., , , and . NEWCAS, page 121-124. IEEE, (2014)Electro-thermal Stimuli for MEMS Testing in FSBM Technology., , , and . J. Electronic Testing, 22 (2): 189-198 (2006)On the Use of an Oscillation-Based Test Methodology for CMOS Micro-Electro-Mechanical Systems., , , and . DATE, page 1120. IEEE Computer Society, (2002)Impact of Technology Spreading on MEMS design Robustness., , , , , , and . VLSI-SOC, volume 218 of IFIP Conference Proceedings, page 241-251. Kluwer, (2001)On the use of standard digital ATE for the analysis of RF signals., , , and . European Test Symposium, page 43-48. IEEE Computer Society, (2010)Remote Labs for Industrial IC Testing., , , , and . TLT, 2 (4): 304-311 (2009)Study of First-Order Thermal Sigma-Delta Architecture for Convective Accelerometers, , , and . CoRR, (2008)Embedded Test Instrument for On-Chip Phase Noise Evaluation of Analog/IF Signals., , , and . DDECS, page 237-242. IEEE Computer Society, (2015)Test Engineering Education in Europe - The CRTC experience through the EuNICE-Test project., , , and . EDUTECH, volume 192 of IFIP, page 63-77. Springer, (2005)A 2-D VHDL-AMS Model for Disk-Shape Piezoelectric Transducers., , and . BMAS, page 148-152. IEEE, (2008)