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An adaptive heuristic algorithm for VLSI test vectors selection.

W. Ibrahim, H. El-Sayed, A. El-Chouemi, and H. Amer. European Journal of Operational Research, 199 (3): 630-639 (2009)

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On axon-inspired communications.V. Beiu, W. Ibrahim, A. Beg, L. Zhang, and M. Tache. ECCTD, page 789-792. IEEE, (2011)An Affordable System for Remotely Monitoring Water Quality in Residential Water Tanks.A. Khaili, A. Mamari, H. Amer, and W. Ibrahim. IIT, page 36-41. IEEE, (2018)GREDA: A Fast and More Accurate Gate Reliability EDA Tool.W. Ibrahim, V. Beiu, and A. Beg. IEEE Trans. on CAD of Integrated Circuits and Systems, 31 (4): 509-521 (2012)Accurate and effective algorithm for estimating the reliability of digital combinational circuits.W. Ibrahim. SpringSim (ANSS), page 9. SCS/ACM, (2013)Novel Heuristic and Genetic Algorithms for the VLSI Test Coverage Problem.W. Ibrahim, A. El-Chouemi, and H. El-Sayed. AICCSA, page 402-408. IEEE Computer Society, (2006)Long Live Small Fan-in Majority Gates Their Reign Looks Like Coming!W. Ibrahim, and V. Beiu. ASAP, page 278-283. IEEE Computer Society, (2007)Using Bayesian Networks to Accurately Calculate the Reliability of Complementary Metal Oxide Semiconductor Gates.W. Ibrahim, and V. Beiu. IEEE Trans. Reliability, 60 (3): 538-549 (2011)Does the brain really outperform Rent's rule?V. Beiu, and W. Ibrahim. ISCAS, page 640-643. IEEE, (2008)Utilizing synthesis to verify Boolean function models.A. Beg, P. Prasad, W. Ibrahim, and E. Shama. ISCAS, page 1576-1579. IEEE, (2008)On the reliability estimation of nano-circuits using neural networks.A. Beg, F. Awwad, W. Ibrahim, and F. Ahmed. Microprocessors and Microsystems - Embedded Hardware Design, 39 (8): 674-685 (2015)

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Disambiguation of "Ibrahim, Walid"

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An adaptive heuristic algorithm for VLSI test vectors selection.

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Disambiguation of "Ibrahim, Walid"

copydeleteadd this publication to your clipboardcommunity posthistory of this postURLDOIBibTeXEndNoteAPAChicagoDIN 1505HarvardMSOffice XML An adaptive heuristic algorithm for VLSI test vectors selection.

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An adaptive heuristic algorithm for VLSI test vectors selection.