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Disambiguation of "Davidovic, Vojkan"

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Effects of hot carrier and irradiation stresses on advanced excimer laser annealed polycrystalline silicon thin film transistors.

, , , , , , , and . Microelectronics Reliability, 44 (9-11): 1631-1636 (2004)

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Other publications of authors with the same name

Reliability Physics and Engineering: Time-to-Failure Modeling, J.W. McPherson. Springer (2010). 318 pp., ISBN: 978-1-4419-6347-5.. Microelectronics Reliability, 52 (1): 300 (2012)Effects of hot carrier and irradiation stresses on advanced excimer laser annealed polycrystalline silicon thin film transistors., , , , , , , and . Microelectronics Reliability, 44 (9-11): 1631-1636 (2004)Negative bias temperature instabilities in sequentially stressed and annealed p-channel power VDMOSFETs., , , , , and . Microelectronics Reliability, 47 (9-11): 1400-1405 (2007)Effects of low gate bias annealing in NBT stressed p-channel power VDMOSFETs., , , , , and . Microelectronics Reliability, 49 (9-11): 1003-1007 (2009)Mechanisms of positive gate bias stress induced instabilities in power VDMOSFETs., , , , , and . Microelectronics Reliability, 41 (9-10): 1373-1378 (2001)Negative bias temperature instability mechanisms in p-channel power VDMOSFETs., , , , , and . Microelectronics Reliability, 45 (9-11): 1343-1348 (2005)Negative bias temperature instability in n-channel power VDMOSFETs., , , , , and . Microelectronics Reliability, 48 (8-9): 1313-1317 (2008)Mechanisms of spontaneous recovery in DC gate bias stressed power VDMOSFETs., , , , , and . IET Circuits, Devices & Systems, 2 (2): 213-221 (2008)Nanoelectronic Devices, B.-G. Park, S.W. Hwang, Y.J. Park. Pan Stanford Publishing Pte. Ltd., Singapore (2012). 406 p., ISBN: 978-981-4364-00-3.. Microelectronics Reliability, 53 (12): 2079 (2013)Effects of electrical stressing in power VDMOSFETs., , , , , , and . Microelectronics Reliability, 45 (1): 115-122 (2005)