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Evidence of an information leakage between logically independent blocks.

L. Zussa, I. Exurville, J. Dutertre, J. Rigaud, B. Robisson, A. Tria, and J. Clédière. CS2@HiPEAC, page 25-30. ACM, (2015)

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To differ between persons with the same name, the academic degree and the title of an important publication will be displayed. You can also use the button next to the name to display some publications already assigned to the person.

Max Schäfer University of Stuttgart

Dr. -Ing. Max Hoßfeld University of Stuttgart

Jean-Noel Grad University of Stuttgart

Max Mustermann Universität Stuttgart

Max Dombrowski University of Stuttgart

Other publications of authors with the same name

Frontside laser fault injection on cryptosystems - Application to the AES' last round -.C. Roscian, J. Dutertre, and A. Tria. HOST, page 119-124. IEEE Computer Society, (2013)How to flip a bit?M. Agoyan, J. Dutertre, A. Mirbaha, D. Naccache, A. Ribotta, and A. Tria. IOLTS, page 235-239. IEEE Computer Society, (2010)Laser-induced fault effects in security-dedicated circuits.R. Leveugle, P. Maistri, P. Vanhauwaert, F. Lu, G. Natale, M. Flottes, B. Rouzeyre, A. Papadimitriou, D. Hély, V. Beroulle and 9 other author(s). VLSI-SoC, page 1-6. IEEE, (2014)Evidence of an information leakage between logically independent blocks.L. Zussa, I. Exurville, J. Dutertre, J. Rigaud, B. Robisson, A. Tria, and J. Clédière. CS2@HiPEAC, page 25-30. ACM, (2015)Electrical model of an NMOS body biased structure in triple-well technology under photoelectric laser stimulation.N. Borrel, C. Champeix, M. Lisart, A. Sarafianos, E. Kussener, W. Rahajandraibe, and J. Dutertre. IRPS, page 1. IEEE, (2015)Practical measurements of data path delays for IP authentication & integrity verification.I. Exurville, J. Fournier, J. Dutertre, B. Robisson, and A. Tria. ReCoSoC, page 1-6. IEEE, (2013)A bulk built-in sensor for detection of fault attacks.R. Bastos, F. Torres, J. Dutertre, M. Flottes, G. Natale, and B. Rouzeyre. HOST, page 51-54. IEEE Computer Society, (2013)Analysis of the fault injection mechanism related to negative and positive power supply glitches using an on-chip voltmeter.L. Zussa, J. Dutertre, J. Clédière, and B. Robisson. HOST, page 130-135. IEEE Computer Society, (2014)A single built-in sensor to check pull-up and pull-down CMOS networks against transient faults.R. Bastos, F. Torres, J. Dutertre, M. Flottes, G. Natale, and B. Rouzeyre. PATMOS, page 157-163. IEEE, (2013)Electromagnetic analysis and fault injection onto secure circuits.P. Maistri, R. Leveugle, L. Bossuet, A. Aubert, V. Fischer, B. Robisson, N. Moro, P. Maurine, J. Dutertre, and M. Lisart. VLSI-SoC, page 1-6. IEEE, (2014)

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Disambiguation of "Dutertre, Jean-Max"

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Evidence of an information leakage between logically independent blocks.

Please choose a person to relate this publication to

Max Schäfer University of Stuttgart

Dr. -Ing. Max Hoßfeld University of Stuttgart

Jean-Noel Grad University of Stuttgart

Max Mustermann Universität Stuttgart

Max Dombrowski University of Stuttgart

Other publications of authors with the same name

Disambiguation

PUMA

Disambiguation of "Dutertre, Jean-Max"

copydeleteadd this publication to your clipboardcommunity posthistory of this postURLDOIBibTeXEndNoteAPAChicagoDIN 1505HarvardMSOffice XML Evidence of an information leakage between logically independent blocks.

Please choose a person to relate this publication to

Max Schäfer University of Stuttgart

Dr. -Ing. Max Hoßfeld University of Stuttgart

Jean-Noel Grad University of Stuttgart

Max Mustermann Universität Stuttgart

Max Dombrowski University of Stuttgart

Other publications of authors with the same name

Disambiguation

copy delete add this publication to your clipboard
community post
history of this post
URL
DOI
BibTeX
EndNote
APA
Chicago
DIN 1505
Harvard
MSOffice XML

Evidence of an information leakage between logically independent blocks.