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Divide and conquer diagnosis for multiple defects.

S. Chao, P. Chen, J. Chen, P. Chen, A. Lin, J. Li, P. Hsueh, C. Kuo, Y. Chen, and J. Li. ITC, page 1-8. IEEE Computer Society, (2014)

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Yi Wang University of Stuttgart

Seda Yilmaz University of Stuttgart

Emre Baris Yildiz University of Stuttgart

Phi-Long Chung University of Stuttgart

Zeynep Hazal Yilmaz University of Stuttgart

Other publications of authors with the same name

Testing of TSV-Induced Small Delay Faults for 3-D Integrated Circuits.C. Kuo, C. Shih, Y. Lu, J. Li, and K. Chakrabarty. IEEE Trans. VLSI Syst., 22 (3): 667-674 (2014)Quantitative Assessment of Diabetics with Various Degrees of Autonomic Neuropathy.C. Chiu, S. Yeh, and Y. Kuo. BIOSIGNALS, page 302-305. SciTePress, (2013)Predicting Vt mean and variance from parallel Id measurement with model-fitting technique.C. Tsai, K. Lee, C. Lin, S. Yu, W. Liau, A. Hou, Y. Chen, C. Kuo, J. Lee, and M. Chao. VTS, page 1-6. IEEE Computer Society, (2016)Employing a Voice-Based Emotion-Recognition Function in a Social Chatbot to Foster Social and Emotional Learning Among Preschoolers.T. Tsai, H. Chang, S. Liao, H. Chiu, K. Hung, C. Kuo, and C. Yang. HCI (LBP), volume 11786 of Lecture Notes in Computer Science, page 341-356. Springer, (2019)A Model-Based-Random-Forest Framework for Predicting Vt Mean and Variance Based on Parallel Id Measurement.C. Lin, C. Tsai, K. Lee, S. Yu, W. Liau, A. Hou, Y. Chen, C. Kuo, J. Lee, and M. Chao. IEEE Trans. on CAD of Integrated Circuits and Systems, 37 (10): 2139-2151 (2018)A Novel Procedure to Identify the Minimized Overlap Boundary of Two Groups by DEA Model.D. Chang, and Y. Kuo. ICCSA (4), volume 3483 of Lecture Notes in Computer Science, page 577-586. Springer, (2005)Using Rough Set Theory and Decision Trees to Diagnose Enterprise Distress - Consideration of Corporate Governance Variables.F. Chen, D. Chi, and C. Kuo. ICIC (2), volume 8589 of Lecture Notes in Computer Science, page 199-211. Springer, (2014)A spur-reduction technique for a 5-GHz frequency synthesizer.C. Kuo, J. Chang, and S. Liu. IEEE Trans. on Circuits and Systems, 53-I (3): 526-533 (2006)Selective metal parallel shunting inductor and its VCO application.C. Wu, C. Kuo, and S. Liu. IEEE Trans. on Circuits and Systems, 52-I (9): 1811-1818 (2005)Referring Image Segmentation via Recurrent Refinement Networks.R. Li, K. Li, Y. Kuo, M. Shu, X. Qi, X. Shen, and J. Jia. CVPR, page 5745-5753. IEEE Computer Society, (2018)

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Disambiguation of "Kuo, Chun-Yi"

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Divide and conquer diagnosis for multiple defects.

Please choose a person to relate this publication to

Yi Wang University of Stuttgart

Seda Yilmaz University of Stuttgart

Emre Baris Yildiz University of Stuttgart

Phi-Long Chung University of Stuttgart

Zeynep Hazal Yilmaz University of Stuttgart

Other publications of authors with the same name

Disambiguation

PUMA

Disambiguation of "Kuo, Chun-Yi"

copydeleteadd this publication to your clipboardcommunity posthistory of this postURLDOIBibTeXEndNoteAPAChicagoDIN 1505HarvardMSOffice XML Divide and conquer diagnosis for multiple defects.

Please choose a person to relate this publication to

Yi Wang University of Stuttgart

Seda Yilmaz University of Stuttgart

Emre Baris Yildiz University of Stuttgart

Phi-Long Chung University of Stuttgart

Zeynep Hazal Yilmaz University of Stuttgart

Other publications of authors with the same name

Disambiguation

copy delete add this publication to your clipboard
community post
history of this post
URL
DOI
BibTeX
EndNote
APA
Chicago
DIN 1505
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MSOffice XML

Divide and conquer diagnosis for multiple defects.