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Disambiguation of "Cho, Seongjae"

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Characterization of 2-bit Recessed Channel Memory with Lifted-Charge Trapping Node (L-CTN) Scheme.

, , , , , , , , and . IEICE Transactions, 91-C (5): 742-746 (2008)

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Gerasimos Chourdakis University of Stuttgart

Hyeongrae Cho University of Stuttgart

Michel Choudalakis University of Stuttgart

Gretchen Chojnacki-Herbers University of Stuttgart

King Cho Wong University of Stuttgart

 

Other publications of authors with the same name

Simulation study on scaling limit of silicon tunneling field-effect transistor under tunneling-predominance., , , , , and . IEICE Electronic Express, 9 (9): 828-833 (2012)Analyses on Current Characteristics of 3-D MOSFET Determined by Junction Doping Profiles for Nonvolatile Memory Devices., , , , , , , and . IEICE Transactions, 90-C (5): 988-993 (2007)Design Consideration for Vertical Nonvolatile Memory Device Regarding Gate-Induced Barrier Lowering (GIBL)., , , , , and . IEICE Transactions, 92-C (5): 620-626 (2009)Simulation of Retention Characteristics in Double-Gate Structure Multi-Bit SONOS Flash Memory., , , , , and . IEICE Transactions, 92-C (5): 659-663 (2009)Accurate Extraction of the Trap Depth from RTS Noise Data by Including Poly Depletion Effect and Surface Potential Variation in MOSFETs., , , and . IEICE Transactions, 90-C (5): 968-972 (2007)A New 1T DRAM Cell: Cone Type 1T DRAM Cell., , , and . IEICE Transactions, 94-C (5): 681-685 (2011)Ge-on-Si photodetector with novel metallization schemes for on-chip optical interconnect., , , , and . ISCE, page 1-2. IEEE, (2015)Establishing Read Operation Bias Schemes for 3-D Pillar Structure Flash Memory Devices to Overcome Paired Cell Interference (PCI)., , , , , , , and . IEICE Transactions, 91-C (5): 731-735 (2008)Recessed Channel Dual Gate Single Electron Transistors (RCDG-SETs) for Room Temperature Operation., , , , , , , , , and . IEICE Transactions, 92-C (5): 647-652 (2009)Investigation of source-to-drain capacitance by DIBL effect of silicon nanowire MOSFETs., , and . IEICE Electronic Express, 7 (19): 1499-1503 (2010)