Author of the publication

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed. You can also use the button next to the name to display some publications already assigned to the person.

 

Other publications of authors with the same name

High-level test synthesis: a survey., and . Integration, 26 (1-2): 79-99 (1998)A Technique for Identifying RTL and Gate-Level Correspondences., , , and . ICCD, page 591-594. IEEE Computer Society, (2000)Hierarchical test generation and design for testability methods for ASPPs and ASIPs., , and . IEEE Trans. on CAD of Integrated Circuits and Systems, 18 (3): 357-370 (1999)A design for testability technique for RTL circuits using control/data flow extraction., , and . ICCAD, page 329-336. IEEE Computer Society / ACM, (1996)High Level Design Validation: Current Practices and Future Directions., , , and . VLSI Design, page 9-11. IEEE Computer Society, (2004)On automatic generation of RTL validation test benches using circuit testing techniques., and . ACM Great Lakes Symposium on VLSI, page 289-294. ACM, (2003)VLSI Implementation of An Efficient ASIC Architecture for Real-Time Rotation of Digital Images., and . IJPRAI, 9 (2): 449-462 (1995)High Level Test Generation for Custom Hardware: An Industrial Perspective.. Asian Test Symposium, page 458. IEEE Computer Society, (2005)Design for Verification at the Register Transfer Level., , and . VLSI Design, page 420-425. IEEE Computer Society, (2002)A BIST scheme for RTL circuits based on symbolic testabilityanalysis., , and . IEEE Trans. on CAD of Integrated Circuits and Systems, 19 (1): 111-128 (2000)