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Weighted time lag plot defect parameter extraction and GPU-based BTI modeling for BTI variability.

V. van Santen, J. Diaz-Fortuny, H. Amrouch, J. Martín-Martínez, R. Rodríguez, R. Castro-López, E. Roca, F. Fernández, J. Henkel, and M. Nafría. IRPS, page 6-1. IEEE, (2018)

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Dr. -Ing. Hussam Amrouch University of Stuttgart

Other publications of authors with the same name

Accurate Thermal-Profile Estimation and Validation for FPGA-Mapped Circuits.A. Amouri, H. Amrouch, T. Ebi, J. Henkel, and M. Tahoori. FCCM, page 57-60. IEEE Computer Society, (2013)Towards interdependencies of aging mechanisms.H. Amrouch, V. van Santen, T. Ebi, V. Wenzel, and J. Henkel. ICCAD, page 478-485. IEEE, (2014)Lucid infrared thermography of thermally-constrained processors.H. Amrouch, and J. Henkel. ISLPED, page 347-352. IEEE, (2015)Stress balancing to mitigate NBTI effects in register files.H. Amrouch, T. Ebi, and J. Henkel. DSN, page 1-10. IEEE Computer Society, (2013)Reliability in Super- and Near-Threshold Computing: A Unified Model of RTN, BTI, and PV.V. van Santen, J. Martín-Martínez, H. Amrouch, M. Nafría, and J. Henkel. IEEE Trans. on Circuits and Systems, 65-I (1): 293-306 (2018)Dynamic resource management for heterogeneous many-cores.J. Henkel, J. Teich, S. Wildermann, and H. Amrouch. ICCAD, page 60. ACM, (2018)Emerging (un-)reliability based security threats and mitigations for embedded systems: special session.H. Amrouch, P. Krishnamurthy, N. Patel, J. Henkel, R. Karri, and F. Khorrami. CASES, page 17:1-17:10. ACM, (2017)Stress-resiliency of AI implementations on FPGAsJ. Krautter, P. Genssler, G. Sepanta, H. Amrouch, and M. Tahoori. International Conference on Field Programmable Logic and Applications (FPL), (2023)GNN4REL : Graph Neural Networks for Predicting Circuit Reliability DegradationL. Alrahis, J. Knechtel, F. Klemme, H. Amrouch, and O. Sinanoglu. 41, 11, page 3826-3837. IEEE, (2022)Towards NN-based Online Estimation of the Full-Chip Temperature and the Rate of Temperature ChangeM. Rapp, O. Elfatairy, M. Wolf, J. Henkel, and H. Amrouch. MLCAD '20 : Proceedings of the 2020 ACM/IEEE Workshop on Machine Learning for CAD, page 95-100. New York, Association for Computing Machinery, (2020)

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Disambiguation of "Amrouch, Hussam"

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Weighted time lag plot defect parameter extraction and GPU-based BTI modeling for BTI variability.

Please choose a person to relate this publication to

Dr. -Ing. Hussam Amrouch University of Stuttgart

Other publications of authors with the same name

Disambiguation

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Disambiguation of "Amrouch, Hussam"

copydeleteadd this publication to your clipboardcommunity posthistory of this postURLDOIBibTeXEndNoteAPAChicagoDIN 1505HarvardMSOffice XML Weighted time lag plot defect parameter extraction and GPU-based BTI modeling for BTI variability.

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Dr. -Ing. Hussam Amrouch University of Stuttgart

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Weighted time lag plot defect parameter extraction and GPU-based BTI modeling for BTI variability.