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Mining global constraints for improving bounded sequential equivalence checking.

, and . DAC, page 743-748. ACM, (2006)

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Efficient Transition Fault ATPG Algorithms Based on Stuck-At Test Vectors., , , and . J. Electronic Testing, 19 (4): 437-445 (2003)Automated Program Synthesis from Object-Oriented Natural Language for Computer Games.. CNL, volume 304 of Frontiers in Artificial Intelligence and Applications, page 71-74. IOS Press, (2018)Simulation-Directed Invariant Mining for Software Verification., and . DATE, page 682-687. ACM, (2008)Parallel Genetic Algorithms for Simulation-Based Sequential Circuit Test Generation., , , , , and . VLSI Design, page 475-481. IEEE Computer Society, (1997)Combination of Structural and State Analysis for Partial Scan., and . VLSI Design, page 134-. IEEE Computer Society, (2001)Reducing Power Consumption by Utilizing Retransmission in Short Range Wireless Network., and . LCN, page 527-533. IEEE Computer Society, (2002)A novel concurrent cache-friendly binary decision diagram construction for multi-core platforms., , and . DATE, page 1427-1430. EDA Consortium San Jose, CA, USA / ACM DL, (2013)Maximizing Impossibilities for Untestable Fault Identification.. DATE, page 949-953. IEEE Computer Society, (2002)Energy-Efficient Logic BIST Based on State Correlation Analysis., and . VTS, page 267-272. IEEE Computer Society, (2003)A SMT-based diagnostic test generation method for combinational circuits., , , and . VTS, page 215-220. IEEE Computer Society, (2012)