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Prediction of Long-term Immunity of a Phase-Locked Loop.

A. Boyer, S. Dhia, B. Li, C. Lemoine, and B. Vrignon. J. Electronic Testing, 28 (6): 791-802 (2012)

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Alexandre Waquet University of Stuttgart

Other publications of authors with the same name

Enhancement of the spatial resolution of near-field immunity maps.A. Boyer, and M. Cavarroc. EMC Compo, page 163-168. IEEE, (2015)Upgrading In-Circuit Test of High Density PCBAs Using Electromagnetic Measurement and Principal Component Analysis.N. Alaoui, A. Boyer, P. Tounsi, and A. Viard. J. Electronic Testing, 34 (6): 749-762 (2018)Analysis and modeling of passive device degradation for a long-term electromagnetic emission study of a DC-DC converter.H. Huang, A. Boyer, and S. Bendhia. Microelectronics Reliability, 55 (9-10): 2061-2066 (2015)Study of the impact of hot carrier injection to immunity of MOSFET to electromagnetic interferences.B. Li, N. Berbel, A. Boyer, S. Bendhia, and R. Fernández-García. Microelectronics Reliability, 51 (9-11): 1557-1560 (2011)Effect of Aging on Power Integrity and Conducted Emission of Digital Integrated Circuits.A. Boyer, and S. Dhia. J. Low Power Electronics, 10 (1): 165-172 (2014)Bandgap failure study due to parasitic bipolar substrate coupling in Smart Power mixed ICs.V. Tomasevic, A. Boyer, and S. Dhia. EMC Compo, page 34-38. IEEE, (2015)EMC performance analysis of a processor/memory system using PCB and Package-On-Package.E. Sicard, A. Boyer, P. Fernandez-Lopez, A. Zhou, N. Marier, and F. Lafon. EMC Compo, page 238-243. IEEE, (2015)Ageing effect on electromagnetic susceptibility of a phase locked loop.B. Li, A. Boyer, S. Bendhia, and C. Lemoine. Microelectronics Reliability, 50 (9-11): 1304-1308 (2010)IC Immunity Modeling Process Validation Using On-Chip Measurements.S. Dhia, A. Boyer, B. Vrignon, and M. Deobarro. J. Electronic Testing, 28 (3): 339-348 (2012)Integrated Circuit Emission Model Extraction with a Fuzzy Logic System.T. Lin, M. Kuo, and A. Boyer. IJFSA, 1 (2): 17-28 (2011)

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Disambiguation of "Boyer, Alexandre"

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Prediction of Long-term Immunity of a Phase-Locked Loop.

Please choose a person to relate this publication to

Alexandre Waquet University of Stuttgart

Other publications of authors with the same name

Disambiguation

PUMA

Disambiguation of "Boyer, Alexandre"

copydeleteadd this publication to your clipboardcommunity posthistory of this postURLDOIBibTeXEndNoteAPAChicagoDIN 1505HarvardMSOffice XML Prediction of Long-term Immunity of a Phase-Locked Loop.

Please choose a person to relate this publication to

Alexandre Waquet University of Stuttgart

Other publications of authors with the same name

Disambiguation

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Prediction of Long-term Immunity of a Phase-Locked Loop.