PUMA

academical publication management
collect, organize, and share publications

( en | de )

 

Disambiguation of "Zorian, Yervant"

Author of the publication

copydeleteadd this publication to your clipboard
2003 Technology Roadmap for Semiconductors.

, , , and . IEEE Computer, 37 (1): 47-56 (2004)

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed. You can also use the button next to the name to display some publications already assigned to the person.

No persons found for author name Zorian, Yervant
add a person with the name Zorian, Yervant
 

Other publications of authors with the same name

Novel Technique for Testing FPGAs., , , , , , , , and . DATE, page 89-94. IEEE Computer Society, (1998)Built-In Self-Test with an Alternating Output., , , and . DATE, page 180-184. IEEE Computer Society, (1998)A Test Interface for Built-In Test of Non-Isolated Scanned Cores., , and . VTS, page 371-378. IEEE Computer Society, (2003)An Efficient March-Based Three-Phase Fault Location and Full Diagnosis Algorithm for Realistic Two-Operation Dynamic Faults in Random Access Memories., , and . VTS, page 95-100. IEEE Computer Society, (2008)SRAM Retention Testing: Zero Incremental Time Integration with March Algorithms., , , , and . VTS, page 66-71. IEEE Computer Society, (2005)Leveraging Infrastructure IP for SoC Yield.. Asian Test Symposium, page 3-5. IEEE Computer Society, (2003)T1: Design for Manufacturability., and . Asian Test Symposium, IEEE Computer Society, (2005)Test Pattern and Test Configuration Generation Methodology for the Logic of RAM-Based FPGA., , , and . Asian Test Symposium, page 254-. IEEE Computer Society, (1997)Design, test & repair methodology for FinFET-based memories.. ITC, page 1. IEEE Computer Society, (2014)Today's SOC test challenges.. ITC, page 2. IEEE Computer Society, (2005)