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Using Statistical Transformations to Improve Compression for Linear Decompressors.

, , and . DFT, page 42-50. IEEE Computer Society, (2005)

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Relating entropy theory to test data compression., and . European Test Symposium, page 94-99. IEEE Computer Society, (2004)Circular BIST with state skipping.. IEEE Trans. VLSI Syst., 10 (5): 668-672 (2002)Guest Editorial., , and . J. Electronic Testing, 24 (1-3): 9-10 (2008)Synthesis of Circuits with Low-Cost Concurrent Error Detection Based on Bose-Lin Codes., and . J. Electronic Testing, 15 (1-2): 145-155 (1999)Deterministic Test Vector Compression/Decompression for Systems-on-a-Chip Using an Embedded Processor., and . J. Electronic Testing, 18 (4-5): 503-514 (2002)Implementing defect tolerance in 3D-ICs by exploiting degrees of freedom in assembly., , and . DFT, page 178-181. IEEE Computer Society, (2012)Input Ordering in Concurrent Checkers to Reduce Power Consumption., and . DFT, page 87-98. IEEE Computer Society, (2002)Adaptive Techniques for Improving Delay Fault Diagnosis., and . VTS, page 168-172. IEEE Computer Society, (1999)Synthesis of Zero-Aliasing Elementary-Tree Space Compactors., and . VTS, page 70-77. IEEE Computer Society, (1998)Synthesis of Circuits with Low-Cost Concurrent Error Detection Based on Bose-Lin Codes., and . VTS, page 309-317. IEEE Computer Society, (1998)