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Disambiguation of "Vargas, Fabian"

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Delay Modeling for Power Noise and Temperature-Aware Design and Test of Digital Systems.

, , , , , and . J. Low Power Electronics, 4 (3): 385-391 (2008)

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To differ between persons with the same name, the academic degree and the title of an important publication will be displayed. You can also use the button next to the name to display some publications already assigned to the person.

Juan Vargas University of Stuttgart

Fabian Schnelle

Design and programming for cable-driven parallel robots in the German pavilion at the EXPO 2015, , , and . Machines, 3 (3): 223-241 (2015)

Dr. Fabian Schubö University of Stuttgart

Fabian Silber University of Stuttgart

Fabian Hampp University of Stuttgart

 

Other publications of authors with the same name

Guest Editorial., and . J. Electronic Testing, 20 (4): 331-332 (2004)Fault Modeling and Simulation of Power Supply Voltage Transients in Digital Systems on a Chip., , , , , and . J. Electronic Testing, 21 (4): 349-363 (2005)A dynamic TDMA-based sleep scheduling to minimize WSN energy consumption., , , , , and . ICNSC, page 1-6. IEEE, (2016)Signal Integrity Enhancement in Digital Circuits., , , , , , , and . IEEE Design & Test of Computers, 25 (5): 452-461 (2008)Time Management for Low-Power Design of Digital Systems., , , , , , and . J. Low Power Electronics, 4 (3): 410-419 (2008)An Approach for Designing Total-Dose Tolerant MCMs Based on Current Monitoring., , and . ITC, page 345-354. IEEE Computer Society, (1995)Rejuvenation of nanoscale logic at NBTI-critical paths using evolutionary TPG., , , , , , , , , and 1 other author(s). LATS, page 1-6. IEEE Computer Society, (2015)A New Approach to Guarantee Critical Task Schedulability in TDMA-Based Bus Access of Multicore Architecture., , , , , , and . LATS, page 1-6. IEEE, (2019)On-chip aging sensor to monitor NBTI effect in nano-scale SRAM., , , and . DDECS, page 354-359. IEEE, (2012)Experimental Results of a Recovery Block Scheme to Handle Noise in Speech Recognition Systems., , and . Asian Test Symposium, page 224-229. IEEE Computer Society, (2002)