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Built-In Self-Test of Transmitter I/Q Mismatch and Nonlinearity Using Self-Mixing Envelope Detector.

, , , , and . IEEE Trans. VLSI Syst., 23 (2): 331-341 (2015)

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Confidence Estimation in Non-RF to RF Correlation-Based Specification Test Compaction., , , and . European Test Symposium, page 35-40. IEEE Computer Society, (2008)Analytical modeling for EVM in OFDM transmitters including the effects of IIP3, I/Q imbalance, noise, AM/AM and AM/PM distortion., , and . ETS, page 1-6. IEEE Computer Society, (2013)Low Cost Time Efficient Multi-tone Test Signal Generation Using OFDM Technique., , , and . J. Electronic Testing, 29 (6): 893-901 (2013)Non-RF to RF Test Correlation Using Learning Machines: A Case Study., , , and . VTS, page 9-14. IEEE Computer Society, (2007)RF Test 101: Defining the Problem, Finding Solutions.. ITC, page 1286. IEEE Computer Society, (2003)An Integrated Approach for Analog Ciruit Testing with a Minmum Number of Detected Parameters., , and . ITC, page 631-640. IEEE Computer Society, (1994)Multifrequency testability analysis for analog circuits., and . VTS, page 54-59. IEEE Computer Society, (1994)RF Testing on a Mixed Signal Tester., , , , , and . J. Electronic Testing, 23 (1): 85-94 (2007)Impedance Mismatch and Lumped Capacitance Effects in High Frequency Testing., , , , and . VTS, page 239-244. IEEE Computer Society, (1998)Built-in-Self Test of transmitter I/Q mismatch using self-mixing envelope detector., , , , and . VTS, page 56-61. IEEE Computer Society, (2012)