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A Group Probing Strategy for Testing Large Number of Chips.

, and . ITC, page 853-856. IEEE Computer Society, (1986)

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Test Vector Generation Based on Correlation Model for Ratio-Iddq., , and . ITC, page 545-554. IEEE Computer Society, (2003)Concurrent Testing of Flow of Control in Simple Microprogrammed Control Units., and . ITC, page 469-479. IEEE Computer Society, (1982)Evaluation of a concurrent error detection method for microprogrammed control units., and . MICRO, page 1-10. ACM/IEEE, (1988)Concurrent Error Detection for Restricted Fault Sets in Sequential Circuits and Microprogrammed Control Units Using Convolutional Codes., and . ITC, page 926-935. IEEE Computer Society, (1991)Incremental test pattern generation., and . VTS, page 244-250. IEEE Computer Society, (1993)Relating the Cyclic Behavior of Linear and Intrainverted Feedback Shift Registers., and . IEEE Trans. Computers, 41 (9): 1088-1100 (1992)Fault Tolerant Distributed Computing with Very High Speed Integrated Circuits., , and . RTSS, page 62-70. IEEE Computer Society, (1981)Output Sufficient Modules for Uniform Decomposition of Synchronous Sequential Circuits, , and . SWAT (FOCS), page 192-199. IEEE Computer Society, (1972)Error Detection with Latency in Sequential Circuits., and . ITC, page 926-933. IEEE Computer Society, (1988)A systematic approach to the design of digital bussing structures., , , , , and . AFIPS Fall Joint Computing Conference (2), volume 41 of AFIPS Conference Proceedings, page 719-740. AFIPS / ACM / Thomson Book Company, Washington D.C., (1972)