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Design of Dynamic Systems Based on Dynamic Fault Trees and Neural Networks.

Z. Zhou, Z. Yan, J. Zhou, G. Jin, D. Dong, and Z. Pan. CASE, page 124-128. IEEE, (2006)

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To differ between persons with the same name, the academic degree and the title of an important publication will be displayed. You can also use the button next to the name to display some publications already assigned to the person.

Qi Pan University of Stuttgart

Karthik Pandaram University of Stuttgart

Mehdiye Panzehir University of Stuttgart

Jiaxin Pan University of Stuttgart

Qifeng Pan University of Stuttgart

Other publications of authors with the same name

Multiple-Steps Step-Stress Accelerated Degradation Modeling Based on Wiener and Gamma Processes.Z. Pan, and N. Balakrishnan. Communications in Statistics - Simulation and Computation, 39 (7): 1384-1402 (2010)A framework of Bayesian lifetime demonstration based on degradation.Z. Pan, T. Liu, Q. Sun, and J. Feng. IEEM, page 26-29. IEEE, (2015)Reliability modeling of degradation of products with multiple performance characteristics based on gamma processes.Z. Pan, and N. Balakrishnan. Rel. Eng. & Sys. Safety, 96 (8): 949-957 (2011)Optimal Design for Step-Stress Accelerated Test with Random Discrete Stress Elevating Times Based on Gamma Degradation Process.M. Amini, S. Shemehsavar, and Z. Pan. Quality and Reliability Eng. Int., 32 (7): 2391-2402 (2016)Design of Dynamic Systems Based on Dynamic Fault Trees and Neural Networks.Z. Zhou, Z. Yan, J. Zhou, G. Jin, D. Dong, and Z. Pan. CASE, page 124-128. IEEE, (2006)Irregular Time-Varying Stress Degradation Path Modeling: a Case Study on Lithium-ion Cell Degradation.T. Liu, Q. Sun, Z. Pan, J. Feng, and Y. Tang. Quality and Reliability Eng. Int., 32 (5): 1889-1902 (2016)An online capacity estimation method for lithium ion battery cells using the significant points.X. Zhou, and Z. Pan. IECON, page 2750-2754. IEEE, (2017)Accelerated-compensated degradation modeling based on synthesized-stress enhancement test data.N. Yang, J. Feng, T. Liu, Z. Pan, and J. Meng. ICSRS, page 261-269. IEEE, (2017)Bivariate Constant-Stress Accelerated Degradation Model and Inference.Z. Pan, N. Balakrishnan, and Q. Sun. Communications in Statistics - Simulation and Computation, 40 (2): 259-269 (2011)Optimal Design for Step-Stress Accelerated Degradation Test with Multiple Performance Characteristics Based on Gamma Processes.Z. Pan, and Q. Sun. Communications in Statistics - Simulation and Computation, 43 (2): 298-314 (2014)

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Disambiguation of "Pan, Zhengqiang"

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Design of Dynamic Systems Based on Dynamic Fault Trees and Neural Networks.

Please choose a person to relate this publication to

Qi Pan University of Stuttgart

Karthik Pandaram University of Stuttgart

Mehdiye Panzehir University of Stuttgart

Jiaxin Pan University of Stuttgart

Qifeng Pan University of Stuttgart

Other publications of authors with the same name

Disambiguation

PUMA

Disambiguation of "Pan, Zhengqiang"

copydeleteadd this publication to your clipboardcommunity posthistory of this postURLDOIBibTeXEndNoteAPAChicagoDIN 1505HarvardMSOffice XML Design of Dynamic Systems Based on Dynamic Fault Trees and Neural Networks.

Please choose a person to relate this publication to

Qi Pan University of Stuttgart

Karthik Pandaram University of Stuttgart

Mehdiye Panzehir University of Stuttgart

Jiaxin Pan University of Stuttgart

Qifeng Pan University of Stuttgart

Other publications of authors with the same name

Disambiguation

copy delete add this publication to your clipboard
community post
history of this post
URL
DOI
BibTeX
EndNote
APA
Chicago
DIN 1505
Harvard
MSOffice XML

Design of Dynamic Systems Based on Dynamic Fault Trees and Neural Networks.