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Automatic Generation of Diagnostic March Tests., and . VTS, page 299-305. IEEE Computer Society, (2001)A Video Signal Processor for MIMD Multiprocessing., , , , and . DAC, page 50-55. ACM Press, (1998)Use of a field programmable gate array for education in manufacturing test and automatic test equipment., , and . IEEE Trans. Education, 44 (3): 239-245 (2001)Using GLFSRs for Pseudo-Random Memory BIST., , , and . MTDT, page 85-94. IEEE Computer Society, (2000)Detection of CMOS address decoder open faults with March and pseudo random memory tests., , and . ITC, page 53-62. IEEE Computer Society, (1998)Parametric Built-In Self-Test of VLSI Systems., and . DATE, page 376-. IEEE Computer Society / ACM, (1999)A data acquisition methodology for on-chip repair of embedded memories., and . ACM Trans. Design Autom. Electr. Syst., 8 (4): 560-576 (2003)Automatic Generation of Diagnostic Memory Tests Based on Fault Decomposition and Output Tracing., and . IEEE Trans. Computers, 53 (9): 1134-1146 (2004)Signal Integrity Problems in Deep Submicron Arising from Interconnects between Cores., , , , , and . VTS, page 28-33. IEEE Computer Society, (1998)Core Interconnect Testing Hazards., , , , , , and . DATE, page 953-954. IEEE Computer Society, (1998)