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Cramer-Rao bounds for continuous-time AR parameter estimation with irregular sampling., and . ICASSP, page 3097-3100. IEEE, (2001)Special session 9B: Embedded tutorial embedded DfT instrumentation: Design, access, retargeting and case studies.. VTS, page 1-2. IEEE Computer Society, (2013)Optimized integration of test compression and sharing for SOC testing., , , and . DATE, page 207-212. EDA Consortium, San Jose, CA, USA, (2007)Test quality analysis and improvement for an embedded asynchronous FIFO., , , , , and . DATE, page 859-864. EDA Consortium, San Jose, CA, USA, (2007)An integrated system-on-chip test framework., and . DATE, page 138-144. IEEE Computer Society, (2001)Design automation for IEEE P1687., , , and . DATE, page 1412-1417. IEEE, (2011)SOC Test Time Minimization Under Multiple Constraints., , and . Asian Test Symposium, page 312-317. IEEE Computer Society, (2003)Test Scheduling and Scan-Chain Division under Power Constraint., and . Asian Test Symposium, page 259-264. IEEE Computer Society, (2001)Accessing Embedded DfT Instruments with IEEE P1687., and . Asian Test Symposium, page 71-76. IEEE Computer Society, (2012)An Integrated Technique for Test Vector Selection and Test Scheduling under Test Time Constraint., and . Asian Test Symposium, page 254-257. IEEE Computer Society, (2004)