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Editorial., and . Microelectronics Reliability, 51 (2): 187 (2011)Editorial., and . Microelectronics Reliability, 45 (12): 1868 (2005)Editorial., and . Microelectronics Reliability, 44 (7): 1031 (2004)Editorial., and . Microelectronics Reliability, 49 (5): 467 (2009)Editorial., and . Microelectronics Reliability, 50 (6): 757 (2010)Reliability investigation and characterization of failure modes in Schottky diodes., , , and . Microelectronics Reliability, 46 (8): 1254-1260 (2006)Reliability validation of compound semiconductor foundry processes., and . Microelectronics Reliability, 52 (9-10): 2210-2214 (2012)Progress of quantum electronics and the future of wireless technologies., and . Microelectronics Journal, 39 (3-4): 669-673 (2008)p-HEMT with tailored field., , , and . Microelectronics Journal, 34 (5-8): 359-361 (2003)Editorial., and . Microelectronics Reliability, (2017)