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Disambiguation of "Du, Boyang"

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FPGA-controlled PCBA power-on self-test using processor's debug features.

, , , , and . DDECS, page 125-130. IEEE, (2016)

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Qian Du University of Stuttgart

Christian Dürnhofer University of Stuttgart

Andrian Dudonu University of Stuttgart

Tobias Dürr University of Stuttgart

Margun Dürr University of Stuttgart

 

Other publications of authors with the same name

Freis: A Web-based Resources and Environment Information System for Agro-ecosystem Management., , , and . CCTA, volume 259 of IFIP Advances in Information and Communication Technology, page 891-898. Springer, (2007)Online Test of Control Flow Errors: A New Debug Interface-Based Approach., , , , , , and . IEEE Trans. Computers, 65 (6): 1846-1855 (2016)Effective Mitigation of Radiation-induced Single Event Transient on Flash-based FPGAs., , , , and . ACM Great Lakes Symposium on VLSI, page 203-208. ACM, (2017)An extended model to support detailed GPGPU reliability analysis., , and . DTIS, page 1-6. IEEE, (2019)FPGA-controlled PCBA power-on self-test using processor's debug features., , , , and . DDECS, page 125-130. IEEE, (2016)Evaluation of transient errors in GPGPUs for safety critical applications: An effective simulation-based fault injection environment., , and . Journal of Systems Architecture - Embedded Systems Design, (2017)Online monitoring soft errors in reconfigurable FPGA during radiation test., and . I2MTC, page 1-5. IEEE, (2017)Quality-Related and Process-Related Fault Monitoring With Online Monitoring Dynamic Concurrent PLS., , , , and . IEEE Access, (2018)A new approach for Total Ionizing Dose effect analysis on Flash-based FPGA., , , , and . Microelectronics Reliability, (2017)Radiation-induced single event transients modeling and testing on nanometric flash-based technologies., , and . Microelectronics Reliability, 55 (9-10): 2087-2091 (2015)