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Statistical and Numerical Approach for a Computer efficient circuit yield analysis.

, , , and . VLSI-SoC (Selected Papers), volume 291 of IFIP, page 1-24. Springer, (2007)

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Statistical RTS model for digital circuits., , and . Microelectronics Reliability, 49 (9-11): 1064-1069 (2009)Técnicas probabilísticas para análise de yield em nível elétrico usando propagação de erros e derivadas numéricas., , , and . RITA, 14 (2): 69-89 (2007)Compact modeling and simulation of Random Telegraph Noise under non-stationary conditions in the presence of random dopants., , , , , and . Microelectronics Reliability, 52 (12): 2955-2961 (2012)Statistical and Numerical Approach for a Computer efficient circuit yield analysis., , , and . VLSI-SoC (Selected Papers), volume 291 of IFIP, page 1-24. Springer, (2007)Modeling and simulation of device variability and reliability at the electrical level.. Universidade Federal do Rio Grande do Sul, Porto Alegre, Brazil, (2011)ndltd.org (oai:lume56.ufrgs.br:10183/65634).Fast and accurate statistical characterization of standard cell libraries., , , and . Microelectronics Reliability, 51 (12): 2341-2350 (2011)Obtaining delay distribution of dynamic logic circuits by error propagation at the electrical level., , , and . VLSI-SoC, page 94-98. IEEE, (2007)Statistical characterization of standard cells using design of experiments with response surface modeling., , , and . DAC, page 77-82. ACM, (2011)Yield Analysis by Error Propagation Using Numerical Derivatives Considering WD and D2D variations., , , and . ISVLSI, page 86-91. IEEE Computer Society, (2007)Probabilistic Approach for Yield Analysis of Dynamic Logic Circuits., , , and . IEEE Trans. on Circuits and Systems, 55-I (8): 2238-2248 (2008)