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Fusing depth, color, and skeleton data for enhanced real-time hand segmentation.

, , and . SUI, page 85. ACM, (2013)

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Enhanced IEEE 1500 test wrapper for testing small RAMs in SOCs., , and . SoCC, page 236-240. IEEE, (2010)Modeling and Testing Comparison Faults of TCAMs with Asymmetric Cells., , and . VTS, page 15-20. IEEE Computer Society, (2009)Area and reliability efficient ECC scheme for 3D RAMs., , and . VLSI-DAT, page 1-4. IEEE, (2012)A Cross-layer Loss Discrimination Scheme for DCCP over the Wireless Network., , and . ANT/SEIT, volume 32 of Procedia Computer Science, page 77-84. Elsevier, (2014)A low-cost built-in self-test scheme for an array of memories., , and . European Test Symposium, page 75-80. IEEE Computer Society, (2010)A design methodology for hybrid carry-lookahead/carry-select adders with reconfigurability., , and . ISCAS (1), page 77-80. IEEE, (2005)A Low-Power Ternary Content Addressable Memory With Pai-Sigma Matchlines., , and . IEEE Trans. VLSI Syst., 20 (10): 1909-1913 (2012)Low-Cost Self-Test Techniques for Small RAMs in SOCs Using Enhanced IEEE 1500 Test Wrappers., and . IEEE Trans. VLSI Syst., 20 (11): 2123-2127 (2012)Some existence results for solutions of generalized vector quasi-equilibrium problems., , and . Math. Meth. of OR, 65 (1): 85-98 (2007)Testing Random Defect and Process Variation Induced Comparison Faults of TCAMs With Asymmetric Cells., , and . IEEE Trans. on CAD of Integrated Circuits and Systems, 29 (11): 1843-1847 (2010)