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Efficient Selection of Observation Points for Functional Tests.

, , , and . ISQED, page 236-241. IEEE Computer Society, (2008)

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An Efficient 2-Phase Strategy to Achieve High Branch Coverage., , , , , and . Asian Test Symposium, page 167-174. IEEE Computer Society, (2011)Test generation for circuits with embedded memories using SMT., , , and . ETS, page 1. IEEE Computer Society, (2013)A SMT-based diagnostic test generation method for combinational circuits., , , and . VTS, page 215-220. IEEE Computer Society, (2012)Functional Test Selection for High Volume Manufacturing., , and . MTV, page 15-19. IEEE Computer Society, (2006)Online Scan Diagnosis : A Novel Approach to Volume Diagnosis., , , and . ITC, page 1-10. IEEE, (2018)A controller-based design-for-testability technique for controller-data path circuits., , and . ICCAD, page 534-540. IEEE Computer Society / ACM, (1995)Fast Enhancement of Validation Test Sets for Improving the Stuck-at Fault Coverage of RTL Circuits., , , and . IEEE Trans. VLSI Syst., 17 (5): 697-708 (2009)Fast Enhancement of Validation Test Sets to Improve Stuck-at Fault Coverage for RTL circuits., , and . VLSI Design, page 504-512. IEEE Computer Society, (2007)A Novel SMT-Based Technique for LFSR Reseeding., , , and . VLSI Design, page 394-399. IEEE Computer Society, (2012)Deriving Signal Constraints to Accelerate Sequential Test Generation., , and . VLSI Design, page 488-494. IEEE Computer Society, (1997)