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Identification and Rejuvenation of NBTI-Critical Logic Paths in Nanoscale Circuits.

M. Jenihhin, G. Squillero, T. Copetti, V. Tihhomirov, S. Kostin, M. Gaudesi, F. Vargas, J. Raik, M. Reorda, L. Poehls, R. Ubar, and G. Medeiros. J. Electronic Testing, 32 (3): 273-289 (2016)

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Raik Elster University of Stuttgart

Other publications of authors with the same name

Automated design error debug using high-level decision diagrams and mutation operators.J. Raik, U. Repinski, A. Chepurov, H. Hantson, R. Ubar, and M. Jenihhin. Microprocessors and Microsystems - Embedded Hardware Design, 37 (4-5): 505-513 (2013)PSL Assertion Checking Using Temporally Extended High-Level Decision Diagrams.M. Jenihhin, J. Raik, A. Chepurov, and R. Ubar. J. Electronic Testing, 25 (6): 289-300 (2009)Automated minimization of concurrent online checkers for Network-on-Chips.P. Saltarelli, B. Niazmand, R. Hariharan, J. Raik, G. Jervan, and T. Hollstein. ReCoSoC, page 1-8. IEEE, (2015)Hierarchical Identification of Untestable Faults in Sequential Circuits.J. Raik, R. Ubar, A. Krivenko, and M. Kruus. DSD, page 668-671. IEEE Computer Society, (2007)Fault Diagnosis in Integrated Circuits with BIST.R. Ubar, S. Kostin, J. Raik, T. Evartson, and H. Lensen. DSD, page 604-610. IEEE Computer Society, (2007)Parallel X-fault simulation with critical path tracing technique.R. Ubar, S. Devadze, J. Raik, and A. Jutman. DATE, page 879-884. IEEE, (2010)Layout to Logic Defect Analysis for Hierarchical Test Generation.M. Jenihhin, J. Raik, R. Ubar, W. Pleskacz, and M. Rakowski. DDECS, page 35-40. IEEE Computer Society, (2007)Extensible open-source framework for translating RTL VHDL IP cores to SystemC.S. Abrar, M. Jenihhin, and J. Raik. DDECS, page 112-115. IEEE Computer Society, (2013)SoCDep2: A framework for dependable task deployment on many-core systems under mixed-criticality constraints.S. Azad, B. Niazmand, P. Ellervee, J. Raik, G. Jervan, and T. Hollstein. ReCoSoC, page 1-6. IEEE, (2016)Evolutionary Approach to Test Generation for Functional BISTY. Skobtsov, D. Ivanov, V. Skobtsov, R. Ubar, and J. Raik. CoRR, (2010)

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Disambiguation of "Raik, Jaan"

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Identification and Rejuvenation of NBTI-Critical Logic Paths in Nanoscale Circuits.

Please choose a person to relate this publication to

Raik Elster University of Stuttgart

Other publications of authors with the same name

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Disambiguation of "Raik, Jaan"

copydeleteadd this publication to your clipboardcommunity posthistory of this postURLDOIBibTeXEndNoteAPAChicagoDIN 1505HarvardMSOffice XML Identification and Rejuvenation of NBTI-Critical Logic Paths in Nanoscale Circuits.

Please choose a person to relate this publication to

Raik Elster University of Stuttgart

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URL
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Identification and Rejuvenation of NBTI-Critical Logic Paths in Nanoscale Circuits.