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X-Filling for Simultaneous Shift- and Capture-Power Reduction in At-Speed Scan-Based Testing., , , and . IEEE Trans. VLSI Syst., 18 (7): 1081-1092 (2010)A Simple memristor Chaotic Circuit with Complex Dynamics., , , , and . I. J. Bifurcation and Chaos, 21 (9): 2629-2645 (2011)Automated detection of burned-out luminaries using indoor positioning., and . IPIN, page 1-9. IEEE, (2015)Military Information Grid-based Integrated Photo-electric Detector Technology., and . GCC, page 416-419. IEEE Computer Society, (2010)On effective TSV repair for 3D-stacked ICs., , and . DATE, page 793-798. IEEE, (2012)FDTD analysis of platform effect reduction with thin film ferrite., , and . RWS, page 59-61. IEEE, (2015)Learning-based power management for multi-core processors via idle period manipulation., and . ASP-DAC, page 115-120. IEEE, (2012)VeriTrust: Verification for Hardware Trust., , , , and . IEEE Trans. on CAD of Integrated Circuits and Systems, 34 (7): 1148-1161 (2015)Test Wrapper Design and Optimization Under Power Constraints for Embedded Cores With Multiple Clock Domains., , and . IEEE Trans. on CAD of Integrated Circuits and Systems, 26 (8): 1539-1547 (2007)Test Pattern Selection for Potentially Harmful Open Defects in Power Distribution Networks., , , and . Asian Test Symposium, page 456-461. IEEE Computer Society, (2009)