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Modeling and simulation of transistor and circuit variability and reliability., , , , , , , , and . CICC, page 1-8. IEEE, (2010)Capturing intrinsic parameter fluctuations using the PSP compact model., , , , , , , and . DATE, page 650-653. IEEE, (2010)Modelling circuit performance variations due to statistical variability: Monte Carlo static timing analysis., , , , , , , , , and . DATE, page 1537-1540. IEEE, (2011)Search results based N-best hypothesis rescoring with maximum entropy classification., , , and . ASRU, page 422-427. IEEE, (2013)Impact of device geometry and doping strategy on linearity and RF performance in Si/SiGe MODFETs., , , , , , , , and . Microelectronics Reliability, 44 (7): 1101-1107 (2004)A low-tech solution to avoid the severe impact of transient errors on the IP interconnect., , , and . DSN, page 478-483. IEEE Computer Society, (2009)Towards a Grid-Enabled Simulation Framework for Nano-CMOS Electronics., , , , , , , and . eScience, page 305-311. IEEE Computer Society, (2007)Optimum partitioning of topologically rectangular grids., , and . EUROSIM, page 179-185. Elsevier, (1996)Impact of statistical parameter set selection on the statistical compact model accuracy: BSIM4 and PSP case study., , , , and . Microelectronics Journal, 44 (1): 7-14 (2013)An advanced statistical compact model strategy for SRAM simulation at reduced VDD., , , , and . ESSDERC, page 205-208. IEEE, (2012)