Author of the publication

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed. You can also use the button next to the name to display some publications already assigned to the person.

 

Other publications of authors with the same name

Cell-aware analysis for small-delay effects and production test results from different fault models., , , , , , , and . ITC, page 1-8. IEEE Computer Society, (2011)Restrict Encoding for Mixed-Mode BIST., , , , , and . VTS, page 179-184. IEEE Computer Society, (2009)Robust Evaluation of Weighted Random Logic BIST Structures in Industrial Designs., , , , , and . DSD, page 823-829. IEEE Computer Society, (2012)Defect-oriented cell-internal testing., , , , , , , and . ITC, page 285-294. IEEE Computer Society, (2010)PASSAT: Efficient SAT-Based Test Pattern Generation for Industrial Circuits., , , , , and . ISVLSI, page 212-217. IEEE Computer Society, (2005)Cell-aware experiences in a high-quality automotive test suite., , , , , , , , , and 5 other author(s). ETS, page 1-6. IEEE, (2014)Combining Multi-Valued Logics in SAT-based ATPG for Path Delay Faults., , , , , and . MEMOCODE, page 181-187. IEEE Computer Society, (2007)Embedded multi-detect ATPG and Its Effect on the Detection of Unmodeled Defects., , , , and . ITC, page 1-10. IEEE Computer Society, (2007)A new SAT-based ATPG for generating highly compacted test sets., , , , and . DDECS, page 230-235. IEEE, (2012)Fault collapsing of multi-conditional faults., , and . DDECS, page 42-47. IEEE Computer Society, (2013)