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Automatic Defect Classification System in Semiconductors EDS Test Based on System Entity Structure Methodology.

, , , and . IEICE Transactions, 93-D (7): 2001-2004 (2010)

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A Semantic Wiki Framework for Reconciling Conflict Collaborations Based on Selecting Consensus Choice., , , , , and . J. UCS, 16 (7): 1024-1035 (2010)RRAM Spare Allocation in Semiconductor Manufacturing for Yield Improvement., and . KES, volume 3215 of Lecture Notes in Computer Science, page 95-102. Springer, (2004)On the Repair of Memory Cells with Spare Rows and Columns for Yield Improvement., , and . AsiaSim, volume 3398 of Lecture Notes in Computer Science, page 713-720. Springer, (2004)Fuzzy Logic-Based Adaptive Communication Management on Wireless Network., , , and . ICCCI, volume 8733 of Lecture Notes in Computer Science, page 40-48. Springer, (2014)Automatic Defect Classification System in Semiconductors EDS Test Based on System Entity Structure Methodology., , , and . IEICE Transactions, 93-D (7): 2001-2004 (2010)Path Renewal Method in Filtering Based Wireless Sensor Networks., , , and . Sensors, 11 (2): 1396-1404 (2011)Design and Implementation of SMS Security System for Wireless Environment., , , , and . KES (2), volume 3682 of Lecture Notes in Computer Science, page 1062-1068. Springer, (2005)Ontology Methodology Based Context Awareness Using System Entity Structure for Network Analysis., , , and . KES-AMSTA, volume 4953 of Lecture Notes in Computer Science, page 232-241. Springer, (2008)Redundancy analysis simulation in semiconductor manufacturing for yield improvement., , and . SpringSim, SCS/ACM, (2009)Implementation of Cloud Computing Environment for Discrete Event System Simulation using Service Oriented Architecture., , , , and . EUC, page 359-362. IEEE Computer Society, (2010)