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A framework for estimating NBTI degradation of microarchitectural components.

M. DeBole, K. Ramakrishnan, V. Balakrishnan, W. Wang, H. Luo, Y. Wang, Y. Xie, Y. Cao, and N. Vijaykrishnan. ASP-DAC, page 455-460. IEEE, (2009)

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Tunnel FET RF Rectifier Design for Energy Harvesting Applications.H. Liu, X. Li, R. Vaddi, K. Ma, S. Datta, and V. Narayanan. IEEE J. Emerg. Sel. Topics Circuits Syst., 4 (4): 400-411 (2014)Energy-performance trade-offs for spatial access methods on memory-resident data.N. An, S. Gurumurthi, A. Sivasubramaniam, N. Vijaykrishnan, M. Kandemir, and M. Irwin. VLDB J., 11 (3): 179-197 (2002)Designing a 3-D FPGA: Switch Box Architecture and Thermal Issues.A. Gayasen, N. Vijaykrishnan, M. Kandemir, and A. Rahman. IEEE Trans. VLSI Syst., 16 (7): 882-893 (2008)An integer linear programming-based tool for wireless sensor networks.I. Kadayif, M. Kandemir, N. Vijaykrishnan, and M. Irwin. J. Parallel Distrib. Comput., 65 (3): 247-260 (2005)Java Runtime Systems: Characterization and Architectural Implications.R. Radhakrishnan, N. Vijaykrishnan, L. John, A. Sivasubramaniam, J. Rubio, and J. Sabarinathan. IEEE Trans. Computers, 50 (2): 131-146 (2001)Design of Thermally Robust Clock Trees Using Dynamically Adaptive Clock Buffers.T. Ragheb, A. Ricketts, M. Mondal, S. Kirolos, G. Link, V. Narayanan, and Y. Massoud. IEEE Trans. on Circuits and Systems, 56-I (2): 374-383 (2009)Nonvolatile Processor Architecture Exploration for Energy-Harvesting Applications.K. Ma, X. Li, S. Li, Y. Liu, J. Sampson, Y. Xie, and V. Narayanan. IEEE Micro, 35 (5): 32-40 (2015)Energy Efficient and Reliable System Design.N. Vijaykrishnan. VLSI-SOC, page 6-9. Technische Universität Darmstadt, Insitute of Microelectronic Systems, (2003)Simultaneous memory and bus partitioning for SoC architectures.S. Srinivasan, F. Angiolini, M. Ruggiero, L. Benini, and N. Vijaykrishnan. SoCC, page 125-128. IEEE, (2005)Performance Improvements through Timing Driven Reconfiguration of Black-Boxes in Platform FPGAs.P. Sundararajan, S. Krishnamurthy, N. Vijaykrishnan, K. Chaudhary, and R. Jayaraman. SoCC, page 105-106. IEEE, (2006)

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A framework for estimating NBTI degradation of microarchitectural components.

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copydeleteadd this publication to your clipboardcommunity posthistory of this postURLDOIBibTeXEndNoteAPAChicagoDIN 1505HarvardMSOffice XML A framework for estimating NBTI degradation of microarchitectural components.

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A framework for estimating NBTI degradation of microarchitectural components.