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TI-BIST: a temperature independent analog BIST for switched-capacitor filters.

, , , , , and . Asian Test Symposium, page 78-83. IEEE Computer Society, (2000)

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Improving yield of torus nocs through fault-diagnosis-and-repair of interconnect faults., , , , , and . IOLTS, page 61-66. IEEE Computer Society, (2009)Embedded software testing: What kind of problem is this?. DATE, page 1486. IEEE, (2010)A constraint-based solution for on-line testing of processors embedded in real-time applications., , , , and . SBCCI, page 68-73. ACM, (2005)The Impact of NoC Reuse on the Testing of Core-based Systems., , , , , and . VTS, page 128-133. IEEE Computer Society, (2003)Evaluation of SEU and crosstalk effects in network-on-chip switches., , , and . SBCCI, page 202-207. ACM, (2006)Improving the Test of NoC-Based SoCs with Help of Compression Schemes., , , and . ISVLSI, page 139-144. IEEE Computer Society, (2008)Special session 12B: Embedded tutorial test and fault tolerance of networks-on-chip., and . VTS, page 354. IEEE Computer Society, (2010)EPE-Mobile - A framework for early performance estimation of mobile applications., , and . Softw., Pract. Exper., 48 (1): 85-104 (2018)A cryptography core tolerant to DFA fault attacks., , and . SBCCI, page 190-195. ACM, (2006)A scalable test strategy for network-on-chip routers., , , , and . ITC, page 9. IEEE Computer Society, (2005)