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An Economic Selecting Model for DFT Strategies., and . VTS, page 412-417. IEEE Computer Society, (2005)Economics of Built-in Self-Test., and . IEEE Design & Test of Computers, 18 (5): 70-79 (2001)Test Strategies and Marriage Partners.. IEEE Design & Test of Computers, 18 (5): 128- (2001)An Efficient Scan Chain Partitioning Scheme with Reduction of Test Data under Routing Constraint., , , and . DFT, page 145-156. IEEE Computer Society, (2006)Test Trade-Offs Take Center Stage at ITC., and . IEEE Design & Test of Computers, 18 (5): 59- (2001)Guest Editors' Introduction: Test and the Product Life Cycle., and . IEEE Design & Test of Computers, 16 (3): 20-22 (1999)Design and Test Economics-An Extra Dimension., and . IEEE Design & Test of Computers, 14 (3): 15-16 (1997)The Efficient Multiple Scan Chain Architecture Reducing Power Dissipation and Test Time., , and . Asian Test Symposium, page 94-97. IEEE Computer Society, (2004)A knowledge-based dispatching model for field service., and . SMC, page 3717-3722. IEEE, (2005)Robust transition density estimation by considering input/output transition behavior., and . ISCAS (5), page 403-406. IEEE, (2001)