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Disambiguation of "Koenemann, Bernd"

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ATE for VLSI: What Challenges Lie Ahead?

, , , , and . VTS, page 318-319. IEEE Computer Society, (1997)

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Bernd Bertsche

Dr. rer. nat. Bernd Schulz University of Stuttgart

Bernd Peters University of Stuttgart

apl. Prof. Dr. Bernd Flemisch University of Stuttgart

Bernd Bertsche

 

Other publications of authors with the same name

Design Validation: Formal Verification vs. Simulation vs. Functional Testing., , , , and . VTS, page 364-365. IEEE Computer Society, (1996)EDA in IBM: past, present, and future., , , , , , , , , and 1 other author(s). IEEE Trans. on CAD of Integrated Circuits and Systems, 19 (12): 1476-1497 (2000)Reducing Time to Volume and Time to Market: Is Silicon Debug and Diagnosis the Answer?, , , , , , and . VTS, page 445-446. IEEE Computer Society, (2002)BIST: Advantages or Limitations?, , , , and . VTS, page 366-367. IEEE Computer Society, (1996)STAGE: A Decoding Engine Suitable for Multi-Compressed Test Data.. Asian Test Symposium, page 142-147. IEEE Computer Society, (2003)DFM, DFT, Silicon Debug and Diagnosis - The Loop to Ensure Product Yield., , , and . VLSI Design, page 14. IEEE Computer Society, (2006)Guaranteeing Quality throughout the Product Life Cycle: On-Line Test and Repair to the Rescue., , , , and . VTS, page 153-154. IEEE Computer Society, (2001)ATE for VLSI: What Challenges Lie Ahead?, , , , and . VTS, page 318-319. IEEE Computer Society, (1997)Test In the Era of "What You see Is NOT What You Get".. ITC, page 12. IEEE Computer Society, (2004)Design/process learning from electrical test.. ICCAD, page 733-738. IEEE Computer Society / ACM, (2004)