%0 Conference Paper %1 amrouch2023rescue %A Amrouch, Hussam %A Klemme, Florian %B Proceedings of the 28th Asia and South Pacific Design Automation Conference %C New York,NY,United States %D 2023 %I IEEE %K %P 76-82 %R 10.1145/3566097.3568344 %T ML to the Rescue : Reliability Estimation from Self-Heating and Aging in Transistors all the Way up Processors %@ 978-1-4503-9783-4

@inproceedings{amrouch2023rescue, added-at = {2023-12-21T15:02:46.000+0100}, address = {New York,NY,United States}, affiliation = {Amrouch, H (Corresponding Author), Univ Stuttgart, Chair Semicond Test & Reliabil STAR, Stuttgart, Germany. Amrouch, Hussam; Klemme, Florian, Univ Stuttgart, Chair Semicond Test & Reliabil STAR, Stuttgart, Germany.}, author = {Amrouch, Hussam and Klemme, Florian}, biburl = {https://puma.ub.uni-stuttgart.de/bibtex/2933af02413a69173e94e47513559466f/unibiblio}, booktitle = {Proceedings of the 28th Asia and South Pacific Design Automation Conference}, doi = {10.1145/3566097.3568344}, eventdate = {2023-01-16/2023-01-19}, eventtitle = {28th Asia and South Pacific Design Automation Conference (ASP-DAC)}, interhash = {f24cb48cf03a6df7bf804ff6104979b5}, intrahash = {933af02413a69173e94e47513559466f}, isbn = {978-1-4503-9783-4}, keywords = {}, language = {eng}, pages = {76-82}, publisher = {IEEE}, research-areas = {Automation & Control Systems; Computer Science; Engineering}, timestamp = {2023-12-21T14:02:46.000+0100}, title = {ML to the Rescue : Reliability Estimation from Self-Heating and Aging in Transistors all the Way up Processors}, unique-id = {WOS:000981940000013}, venue = {Tokyo, Japan}, year = 2023 }