%0 Conference Paper %1 weiser2023onstate %A Weiser, Mathias %A Muñoz Barón, Kevin %A Fink, Tobias %A Kallfass, Ingmar %B 2023 IEEE Applied Power Electronics Conference and Exposition (APEC) %D 2023 %I IEEE %K %P 637-644 %R 10.1109/APEC43580.2023.10131492 %T A Fast ON-State Drain-to-Source Voltage Amplifier for the Dynamic Characterization of GaN Power Transistors %@ 978-1-6654-7539-6 and 978-1-6654-7540-2

@inproceedings{weiser2023onstate, added-at = {2024-01-16T11:27:56.000+0100}, affiliation = {Weiser, MCJ (Corresponding Author), Univ Stuttgart, Inst Robust Power Semicond Syst ILH, Stuttgart, Germany. Weiser, Mathias C. J.; Baron, Kevin Munoz; Fink, Tobias; Kallfass, Ingmar, Univ Stuttgart, Inst Robust Power Semicond Syst ILH, Stuttgart, Germany.}, author = {Weiser, Mathias and Muñoz Barón, Kevin and Fink, Tobias and Kallfass, Ingmar}, biburl = {https://puma.ub.uni-stuttgart.de/bibtex/2982d2921c84b2693ca3d5bcebc5077d2/unibiblio}, booktitle = {2023 IEEE Applied Power Electronics Conference and Exposition (APEC)}, doi = {10.1109/APEC43580.2023.10131492}, eventdate = {2023-03-19/2023-03-23}, eventtitle = {2023 IEEE Applied Power Electronics Conference and Exposition (APEC)}, interhash = {e16cc689ba76e740a66be2b523b1faa5}, intrahash = {982d2921c84b2693ca3d5bcebc5077d2}, isbn = {{978-1-6654-7539-6} and {978-1-6654-7540-2}}, keywords = {}, language = {eng}, pages = {637-644}, publisher = {IEEE}, timestamp = {2024-01-16T10:27:56.000+0100}, title = {A Fast ON-State Drain-to-Source Voltage Amplifier for the Dynamic Characterization of GaN Power Transistors}, unique-id = {WOS:001012113600097}, venue = {Orlando, USA}, year = 2023 }