%0 Journal Article %1 journals/mr/BonfertGWFKS06 %A Bonfert, Detlef %A Gieser, Horst A. %A Wolf, Heinrich %A Frank, M. %A Konrad, A. %A Schulz, J. %D 2006 %J Microelectronics Reliability %K dblp %N 9-11 %P 1629-1633 %T Transient-induced latch-up test setup for wafer-level and package-level. %U http://dblp.uni-trier.de/db/journals/mr/mr46.html#BonfertGWFKS06 %V 46

@article{journals/mr/BonfertGWFKS06, added-at = {2018-11-30T00:00:00.000+0100}, author = {Bonfert, Detlef and Gieser, Horst A. and Wolf, Heinrich and Frank, M. and Konrad, A. and Schulz, J.}, biburl = {https://puma.ub.uni-stuttgart.de/bibtex/22e655b98fffc5a189b0169d4348cd2fa/dblp}, ee = {https://doi.org/10.1016/j.microrel.2006.08.002}, interhash = {d40a4a73dd0cb64d5a1ab3d45b350c6a}, intrahash = {2e655b98fffc5a189b0169d4348cd2fa}, journal = {Microelectronics Reliability}, keywords = {dblp}, number = {9-11}, pages = {1629-1633}, timestamp = {2019-09-27T10:58:24.000+0200}, title = {Transient-induced latch-up test setup for wafer-level and package-level.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr46.html#BonfertGWFKS06}, volume = 46, year = 2006 }