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%0 Journal Article
%1 journals/mr/HoussaAGGH07
%A Houssa, M.
%A Aoulaiche, Marc
%A Gendt, Stefan De
%A Groeseneken, Guido
%A Heyns, Marc M.
%D 2007
%J Microelectronics Reliability
%K dblp
%N 6
%P 880-889
%T Negative bias temperature instabilities in HfSiO(N)-based MOSFETs: Electrical characterization and modeling.
%U http://dblp.uni-trier.de/db/journals/mr/mr47.html#HoussaAGGH07
%V 47
@article{journals/mr/HoussaAGGH07,
added-at = {2012-11-15T00:00:00.000+0100},
author = {Houssa, M. and Aoulaiche, Marc and Gendt, Stefan De and Groeseneken, Guido and Heyns, Marc M.},
biburl = {https://puma.ub.uni-stuttgart.de/bibtex/2044b7ddae523821bf9936985ea23baa7/dblp},
ee = {http://dx.doi.org/10.1016/j.microrel.2006.10.010},
interhash = {ce7a8b857801909917bdefefaa604ae0},
intrahash = {044b7ddae523821bf9936985ea23baa7},
journal = {Microelectronics Reliability},
keywords = {dblp},
number = 6,
pages = {880-889},
timestamp = {2016-02-02T02:01:11.000+0100},
title = {Negative bias temperature instabilities in HfSiO(N)-based MOSFETs: Electrical characterization and modeling.},
url = {http://dblp.uni-trier.de/db/journals/mr/mr47.html#HoussaAGGH07},
volume = 47,
year = 2007
}
