%0 Journal Article %1 arezki2021traceable %A Arezki, Yassir %A Su, Rong %A Heikkinen, Ville %A Leprete, François %A Posta, Pavel %A Bitou, Youichi %A Schober, Christian %A Mehdi-Souzani, Charyar %A Alzahrani, Bandar Abdulrahman Mohammed %A Zhang, Xiangchao %A Kondo, Yohan %A Pruß, Christof %A Ledl, Vit %A Anwer, Nabil %A Bouazizi, Mohamed Lamjed %A Leach, Richard %A Nouira, Hichem %D 2021 %I MDPI %J Sensors %K %N 4 %P 1103 %R 10.3390/s21041103 %T Traceable Reference Full Metrology Chain for Innovative Aspheric and Freeform Optical Surfaces Accurate at the Nanometer Level %V 21

@article{arezki2021traceable, added-at = {2023-08-31T14:46:34.000+0200}, affiliation = {Nouira, H (Corresponding Author), Lab Natl Metrol & Essais LNE, Lab Commun Metrol LCM, 1 Rue Gaston Boissier, F-75015 Paris, France. Mehdi-Souzani, C (Corresponding Author), Univ Paris Saclay, Univ Sorbonne Paris Nord, ENS Paris Saclay, LURPA, F-91190 Gif Sur Yvette, France. Arezki, Yassir; Nouira, Hichem, Lab Natl Metrol & Essais LNE, Lab Commun Metrol LCM, 1 Rue Gaston Boissier, F-75015 Paris, France. Arezki, Yassir; Mehdi-Souzani, Charyar; Anwer, Nabil, Univ Paris Saclay, Univ Sorbonne Paris Nord, ENS Paris Saclay, LURPA, F-91190 Gif Sur Yvette, France. Su, Rong; Leach, Richard, Univ Nottingham UNOTT, Mfg Metrol Team, Fac Engn, Nottingham NG8 1BB, England. Heikkinen, Ville, VTT Tech Res Ctr Finland Ltd, Ctr Metrol MIKES, Tekniikantie 1, Espoo 02150, Finland. Leprete, Francois, THALES LAS France, Etab St Heand, Blvd Ravel Malval, F-42570 St Heand, France. Posta, Pavel; Ledl, Vit, Czech Acad Sci, Inst Plasma Phys, TOPTEC, Slovankou 1782-3, Prague 18200, Czech Republic. Bitou, Youichi; Kondo, Yohan, Natl Inst Adv Ind Sci & Technol, Natl Metrol Inst Japan NMIJ, Tsukuba, Ibaraki 3058563, Japan. Schober, Christian; Pruss, Christof, Univ Stuttgart, Inst Appl Opt ITO, Pfaffenwaldring 9, D-70569 Stuttgart, Germany. Alzahrani, Bandar Abdulrahman Mohammed; Bouazizi, Mohamed Lamjed, Prince Sattam bin Abdulaziz Univ PSAU, Dept Mech Engn, Coll Engn, Alkharj 16273, Saudi Arabia. Zhang, Xiangchao, Fudan Univ, Shanghai Engn Ctr Ultraprecis Opt Mfg, Shanghai 200438, Peoples R China.}, author = {Arezki, Yassir and Su, Rong and Heikkinen, Ville and Leprete, François and Posta, Pavel and Bitou, Youichi and Schober, Christian and Mehdi-Souzani, Charyar and Alzahrani, Bandar Abdulrahman Mohammed and Zhang, Xiangchao and Kondo, Yohan and Pruß, Christof and Ledl, Vit and Anwer, Nabil and Bouazizi, Mohamed Lamjed and Leach, Richard and Nouira, Hichem}, biburl = {https://puma.ub.uni-stuttgart.de/bibtex/2ecc6f982cc092ff1a3d4c45cfe44f53a/puma-wartung}, doi = {10.3390/s21041103}, interhash = {c5692d10cbed0326b98b81114d8fb265}, intrahash = {ecc6f982cc092ff1a3d4c45cfe44f53a}, issn = {1424-8220}, journal = {Sensors}, keywords = {}, language = {eng}, number = 4, orcid-numbers = {anwer, nabil/0000-0002-0771-4685 Zhang, Xiangchao/0000-0003-3809-1262 Leach, Richard/0000-0001-5777-067X Su, Rong/0000-0003-0776-3716 Kondo, Yohan/0000-0002-7905-1817}, pages = 1103, publisher = {MDPI}, research-areas = {Chemistry; Engineering; Instruments & Instrumentation}, researcherid-numbers = {anwer, nabil/AAG-3942-2019 Zhang, Xiangchao/U-9137-2019 Su, Rong/N-5148-2018 Kondo, Yohan/L-8068-2018}, timestamp = {2023-08-31T12:46:34.000+0200}, title = {Traceable Reference Full Metrology Chain for Innovative Aspheric and Freeform Optical Surfaces Accurate at the Nanometer Level}, unique-id = {ISI:000624696400001}, volume = 21, year = 2021 }