%0 Conference Paper %1 anders2023survey %A Anders, Jens %A Andreu, Pablo %A Becker, Bernd %A Becker, Steffen %A Cantoro, Riccardo %A Deligiannis, Nikolaos I. %A Elhamawy, Nourhan %A Faller, Tobias %A Hernandez, Carles %A Mentens, Nele %A Rizi, Mahnaz Namazi %A Polian, Ilia %A Sajadi, Abolfazl %A Sauer, Mathias %A Schwachhofer, Denis %A Reorda, Matteo Sonza %A Stefanov, Todor %A Tuzov, Ilya %A Wagner, Stefan %A Zidarič, Nuša %B 2023 IEEE European Test Symposium (ETS) %D 2023 %I IEEE %K %R 10.1109/ETS56758.2023.10174099 %T A Survey of Recent Developments in Testability, Safety and Security of RISC-V Processors %@ 979-8-3503-3634-4 and 979-8-3503-3635-1

@inproceedings{anders2023survey, added-at = {2024-01-16T10:34:20.000+0100}, affiliation = {Anders, J (Corresponding Author), Univ Stuttgart, Inst Smart Sensors, Stuttgart, Germany. Becker, Bernd; Faller, Tobias, Univ Freiburg, Dept Comp Sci, Freiburg, Germany. Elhamawy, Nourhan; Polian, Ilia; Schwachhofer, Denis, Univ Stuttgart, Inst Comp Architecture \& Comp Engn, Stuttgart, Germany. Cantoro, Riccardo; Deligiannis, Nikolaos I.; Reorda, Matteo Sonza, Politecn Torino, Dept Control \& Comp Engn, Turin, Italy. Mentens, Nele; Rizi, Mahnaz Namazi; Sajadi, Abolfazl; Stefanov, Todor; Zidaric, Nu'ga, Leiden Univ, LIACS, Leiden, Netherlands. Andreu, Pablo; Tuzov, Ilya, Univ Politecn Valencia, Valencia, Spain. Becker, Steffen; Wagner, Stefan, Univ Stuttgart, Inst Software Engn, Stuttgart, Germany. Anders, Jens, Univ Stuttgart, Inst Smart Sensors, Stuttgart, Germany. Sauer, Mathias, Advantest Europe, Boblingen, Germany.}, author = {Anders, Jens and Andreu, Pablo and Becker, Bernd and Becker, Steffen and Cantoro, Riccardo and Deligiannis, Nikolaos I. and Elhamawy, Nourhan and Faller, Tobias and Hernandez, Carles and Mentens, Nele and Rizi, Mahnaz Namazi and Polian, Ilia and Sajadi, Abolfazl and Sauer, Mathias and Schwachhofer, Denis and Reorda, Matteo Sonza and Stefanov, Todor and Tuzov, Ilya and Wagner, Stefan and Zidarič, Nuša}, biburl = {https://puma.ub.uni-stuttgart.de/bibtex/2df2452db528d560fcfc6e15f9453775d/unibiblio}, booktitle = {2023 IEEE European Test Symposium (ETS)}, doi = {10.1109/ETS56758.2023.10174099}, eventdate = {2023-05-22/2023-05-26}, eventtitle = {2023 IEEE European Test Symposium (ETS)}, interhash = {9cc35652b97b7e6f3898825c041d1553}, intrahash = {df2452db528d560fcfc6e15f9453775d}, isbn = {{979-8-3503-3634-4} and {979-8-3503-3635-1}}, keywords = {}, language = {eng}, orcid-numbers = {Sonza Reorda, Matteo/0000-0003-2899-7669}, publisher = {IEEE}, researcherid-numbers = {Sonza Reorda, Matteo/J-1775-2018}, timestamp = {2024-01-16T09:34:20.000+0100}, title = {A Survey of Recent Developments in Testability, Safety and Security of RISC-V Processors}, unique-id = {WOS:001032757100030}, venue = {Venezia, Italy}, year = 2023 }