%0 Conference Paper %1 appello2021systemlevel %A Appello, D. %A Chen, H. H. %A Sauer, M. %A Polian, Ilia %A Bernardi, P. %A Reorda, M. Sonza %B 2021 IEEE 27th International Symposium on On-Line Testing and Robust System Design (IOLTS) %C Piscataway %D 2021 %I IEEE %K %R 10.1109/IOLTS52814.2021.9486708 %T System-Level Test : State of the Art and Challenges %@ 978-1-6654-3370-9 and 978-1-6654-3371-6

@inproceedings{appello2021systemlevel, added-at = {2023-08-31T14:52:06.000+0200}, address = {Piscataway}, affiliation = {Appello, D (Corresponding Author), STMicroelect Srl, Automot Prod Grp, Geneva, Switzerland. Appello, D., STMicroelect Srl, Automot Prod Grp, Geneva, Switzerland. Chen, H. H., MediaTek Inc, Hsinchu, Taiwan. Sauer, M., Advantest Europe, Munich, Germany. Polian, I, Univ Stuttgart, Stuttgart, Germany. Bernardi, P.; Reorda, M. Sonza, Politecn Torino, Turin, Italy.}, author = {Appello, D. and Chen, H. H. and Sauer, M. and Polian, Ilia and Bernardi, P. and Reorda, M. Sonza}, biburl = {https://puma.ub.uni-stuttgart.de/bibtex/21fe74bd409cea9b96bed5a22e8ab23d6/puma-wartung}, booktitle = {2021 IEEE 27th International Symposium on On-Line Testing and Robust System Design (IOLTS)}, doi = {10.1109/IOLTS52814.2021.9486708}, eventdate = {2021-06-28/2021-06-30}, eventtitle = {2021 IEEE 27th International Symposium on On-Line Testing and Robust System Design (IOLTS)}, interhash = {94360478a8e2f3e28f9ee07879441c97}, intrahash = {1fe74bd409cea9b96bed5a22e8ab23d6}, isbn = {{978-1-6654-3370-9} and {978-1-6654-3371-6}}, keywords = {}, language = {eng}, publisher = {IEEE}, research-areas = {Computer Science; Engineering}, timestamp = {2023-08-31T12:52:06.000+0200}, title = {System-Level Test : State of the Art and Challenges}, unique-id = {WOS:000698752600025}, venue = {Online}, year = 2021 }