IEEE transactions on computer-aided design of integrated circuits and systems
venue
Online
research-areas
Computer Science; Engineering
affiliations
University of Stuttgart
language
eng
eventdate
2021-10-08/2021-10-15
eventtitle
ACM/IEEE International Conference on Hardware/Software Codesign and System Synthesis / International Conference on Compilers, Architectures, and Synthesis for Embedded Systems / International Conference on Embedded Software part of the Embedded Systems Week
affiliation
Alrahis, L (Corresponding Author), New York Univ Abu Dhabi, Div Engn, Abu Dhabi, U Arab Emirates.
Alrahis, Lilas; Knechtel, Johann; Sinanoglu, Ozgur, New York Univ Abu Dhabi, Div Engn, Abu Dhabi, U Arab Emirates.
Klemme, Florian; Amrouch, Hussam, Univ Stuttgart, Dept Comp Sci, D-70174 Stuttgart, Germany.
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%0 Conference Paper
%1 alrahis2022gnn4rel
%A Alrahis, Lilas
%A Knechtel, Johann
%A Klemme, Florian
%A Amrouch, Hussam
%A Sinanoglu, Ozgur
%B IEEE transactions on computer-aided design of integrated circuits and systems
%D 2022
%I IEEE
%K
%N 41, 11
%P 3826-3837
%R 10.1109/TCAD.2022.3197521
%T GNN4REL : Graph Neural Networks for Predicting Circuit Reliability Degradation
@inproceedings{alrahis2022gnn4rel,
added-at = {2023-04-06T12:43:38.000+0200},
affiliation = {Alrahis, L (Corresponding Author), New York Univ Abu Dhabi, Div Engn, Abu Dhabi, U Arab Emirates.
Alrahis, Lilas; Knechtel, Johann; Sinanoglu, Ozgur, New York Univ Abu Dhabi, Div Engn, Abu Dhabi, U Arab Emirates.
Klemme, Florian; Amrouch, Hussam, Univ Stuttgart, Dept Comp Sci, D-70174 Stuttgart, Germany.},
affiliations = {University of Stuttgart},
author = {Alrahis, Lilas and Knechtel, Johann and Klemme, Florian and Amrouch, Hussam and Sinanoglu, Ozgur},
biburl = {https://puma.ub.uni-stuttgart.de/bibtex/25695f4208ca45a6b6301a6e234c231f8/unibiblio},
doi = {10.1109/TCAD.2022.3197521},
eventdate = {2021-10-08/2021-10-15},
eventtitle = {ACM/IEEE International Conference on Hardware/Software Codesign and System Synthesis / International Conference on Compilers, Architectures, and Synthesis for Embedded Systems / International Conference on Embedded Software part of the Embedded Systems Week},
interhash = {8deaef97593a2270ece942d5632e937a},
intrahash = {5695f4208ca45a6b6301a6e234c231f8},
keywords = {},
language = {eng},
number = {41, 11},
orcid-numbers = {Knechtel, Johann/0000-0001-5093-2939
Sinanoglu, Ozgur/0000-0003-0782-0397},
pages = {3826-3837},
publisher = {IEEE},
research-areas = {Computer Science; Engineering},
series = {IEEE transactions on computer-aided design of integrated circuits and systems},
timestamp = {2023-04-06T12:43:46.000+0200},
title = {GNN4REL : Graph Neural Networks for Predicting Circuit Reliability Degradation},
unique-id = {WOS:000877295000026},
venue = {Online},
year = 2022
}