%0 Conference Paper %1 alrahis2022gnn4rel %A Alrahis, Lilas %A Knechtel, Johann %A Klemme, Florian %A Amrouch, Hussam %A Sinanoglu, Ozgur %B IEEE transactions on computer-aided design of integrated circuits and systems %D 2022 %I IEEE %K %N 41, 11 %P 3826-3837 %R 10.1109/TCAD.2022.3197521 %T GNN4REL : Graph Neural Networks for Predicting Circuit Reliability Degradation

@inproceedings{alrahis2022gnn4rel, added-at = {2023-04-06T12:43:38.000+0200}, affiliation = {Alrahis, L (Corresponding Author), New York Univ Abu Dhabi, Div Engn, Abu Dhabi, U Arab Emirates. Alrahis, Lilas; Knechtel, Johann; Sinanoglu, Ozgur, New York Univ Abu Dhabi, Div Engn, Abu Dhabi, U Arab Emirates. Klemme, Florian; Amrouch, Hussam, Univ Stuttgart, Dept Comp Sci, D-70174 Stuttgart, Germany.}, affiliations = {University of Stuttgart}, author = {Alrahis, Lilas and Knechtel, Johann and Klemme, Florian and Amrouch, Hussam and Sinanoglu, Ozgur}, biburl = {https://puma.ub.uni-stuttgart.de/bibtex/25695f4208ca45a6b6301a6e234c231f8/unibiblio}, doi = {10.1109/TCAD.2022.3197521}, eventdate = {2021-10-08/2021-10-15}, eventtitle = {ACM/IEEE International Conference on Hardware/Software Codesign and System Synthesis / International Conference on Compilers, Architectures, and Synthesis for Embedded Systems / International Conference on Embedded Software part of the Embedded Systems Week}, interhash = {8deaef97593a2270ece942d5632e937a}, intrahash = {5695f4208ca45a6b6301a6e234c231f8}, keywords = {}, language = {eng}, number = {41, 11}, orcid-numbers = {Knechtel, Johann/0000-0001-5093-2939 Sinanoglu, Ozgur/0000-0003-0782-0397}, pages = {3826-3837}, publisher = {IEEE}, research-areas = {Computer Science; Engineering}, series = {IEEE transactions on computer-aided design of integrated circuits and systems}, timestamp = {2023-04-06T12:43:46.000+0200}, title = {GNN4REL : Graph Neural Networks for Predicting Circuit Reliability Degradation}, unique-id = {WOS:000877295000026}, venue = {Online}, year = 2022 }