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%0 Journal Article
%1 journals/tvlsi/TangWEPBSHW06
%A Tang, Yuyi
%A Wunderlich, Hans-Joachim
%A Engelke, Piet
%A Polian, Ilia
%A Becker, Bernd
%A Schlöffel, Jürgen
%A Hapke, Friedrich
%A Wittke, Michael
%D 2006
%J IEEE Trans. VLSI Syst.
%K dblp
%N 2
%P 193-202
%T X-masking during logic BIST and its impact on defect coverage.
%U http://dblp.uni-trier.de/db/journals/tvlsi/tvlsi14.html#TangWEPBSHW06
%V 14
@article{journals/tvlsi/TangWEPBSHW06,
added-at = {2016-03-15T00:00:00.000+0100},
author = {Tang, Yuyi and Wunderlich, Hans-Joachim and Engelke, Piet and Polian, Ilia and Becker, Bernd and Schlöffel, Jürgen and Hapke, Friedrich and Wittke, Michael},
biburl = {https://puma.ub.uni-stuttgart.de/bibtex/2e4bb8a9ab4ebee7b4b559b6ff483c4f4/dblp},
ee = {http://dx.doi.org/10.1109/TVLSI.2005.863742},
interhash = {8aa1192aa96d7d6c1700ab87a34fdc83},
intrahash = {e4bb8a9ab4ebee7b4b559b6ff483c4f4},
journal = {IEEE Trans. VLSI Syst.},
keywords = {dblp},
number = 2,
pages = {193-202},
timestamp = {2016-03-16T10:32:18.000+0100},
title = {X-masking during logic BIST and its impact on defect coverage.},
url = {http://dblp.uni-trier.de/db/journals/tvlsi/tvlsi14.html#TangWEPBSHW06},
volume = 14,
year = 2006
}
