2021 International Symposium on VLSI Design, Automation and Test (VLSI-DAT)
year
2021
pages
1-4
publisher
IEEE
venue
Hsinchu, Taiwan and Online
isbn
978-1-6654-1915-4 and 978-1-6654-3028-9
language
eng
eventdate
2021-04-19/2021-04-21
eventtitle
2021 International Symposium on VLSI Design, Automation and Test (VLSI-DAT)
affiliation
van Santen, VM (Corresponding Author), Univ Stuttgart, Dept Comp Sci, Stuttgart, Germany.
van Santen, Victor M.; Amrouch, Hussam, Univ Stuttgart, Dept Comp Sci, Stuttgart, Germany.
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%0 Conference Paper
%1 santen2021selfheating
%A Santen, Victor M. van
%A Schillinger, Linda
%A Amrouch, Hussam
%B 2021 International Symposium on VLSI Design, Automation and Test (VLSI-DAT)
%C Piscataway
%D 2021
%I IEEE
%K
%P 1-4
%R 10.1109/VLSI-DAT52063.2021.9427356
%T Self-Heating Effects from Transistors to Gates
%@ 978-1-6654-1915-4 and 978-1-6654-3028-9
@inproceedings{santen2021selfheating,
added-at = {2023-08-31T14:59:30.000+0200},
address = {Piscataway},
affiliation = {van Santen, VM (Corresponding Author), Univ Stuttgart, Dept Comp Sci, Stuttgart, Germany.
van Santen, Victor M.; Amrouch, Hussam, Univ Stuttgart, Dept Comp Sci, Stuttgart, Germany.},
author = {Santen, Victor M. van and Schillinger, Linda and Amrouch, Hussam},
biburl = {https://puma.ub.uni-stuttgart.de/bibtex/2b8e05c23c91754168825d5dd5f882b12/puma-wartung},
booktitle = {2021 International Symposium on VLSI Design, Automation and Test (VLSI-DAT)},
doi = {10.1109/VLSI-DAT52063.2021.9427356},
eventdate = {2021-04-19/2021-04-21},
eventtitle = {2021 International Symposium on VLSI Design, Automation and Test (VLSI-DAT)},
interhash = {603ef38b7a1c175105924a2fe53b597e},
intrahash = {b8e05c23c91754168825d5dd5f882b12},
isbn = {{978-1-6654-1915-4} and {978-1-6654-3028-9}},
keywords = {},
language = {eng},
pages = {1-4},
publisher = {IEEE},
timestamp = {2023-08-31T12:59:30.000+0200},
title = {Self-Heating Effects from Transistors to Gates},
unique-id = {WOS:000675593900045},
venue = {{Hsinchu, Taiwan} and {Online}},
year = 2021
}