%0 Journal Article %1 journals/tvlsi/BahukudumbiC07 %A Bahukudumbi, Sudarshan %A Chakrabarty, Krishnendu %D 2007 %J IEEE Trans. VLSI Syst. %K dblp %N 10 %P 1144-1154 %T Wafer-Level Modular Testing of Core-Based SoCs. %U http://dblp.uni-trier.de/db/journals/tvlsi/tvlsi15.html#BahukudumbiC07 %V 15

@article{journals/tvlsi/BahukudumbiC07, added-at = {2007-11-04T00:00:00.000+0100}, author = {Bahukudumbi, Sudarshan and Chakrabarty, Krishnendu}, biburl = {https://puma.ub.uni-stuttgart.de/bibtex/20a2e884df3e769672403e2473f5384e9/dblp}, ee = {http://dx.doi.org/10.1109/TVLSI.2007.903943}, interhash = {56d56b28530b5bfb4cacb2a09df1e025}, intrahash = {0a2e884df3e769672403e2473f5384e9}, journal = {IEEE Trans. VLSI Syst.}, keywords = {dblp}, number = 10, pages = {1144-1154}, timestamp = {2016-02-02T02:12:46.000+0100}, title = {Wafer-Level Modular Testing of Core-Based SoCs.}, url = {http://dblp.uni-trier.de/db/journals/tvlsi/tvlsi15.html#BahukudumbiC07}, volume = 15, year = 2007 }