%0 Conference Paper %1 kumar2022crosslayer %A Kumar, Shubham %A Chatterjee, Swetaki %A Thomann, Simon %A Genßler, Paul R. %A Chauhan, Yogesh Singh %A Amrouch, Hussam %B 2022 IFIP/IEEE 30th International Conference on Very Large Scale Integration (VLSI-SoC) %C Piscataway %D 2022 %I IEEE %K %R 10.1109/VLSI-SoC54400.2022.9939626 %T Cross-layer FeFET Reliability Modeling for Robust Hyperdimensional Computing %@ 978-1-6654-9005-4 and 978-1-6654-9006-1

@inproceedings{kumar2022crosslayer, added-at = {2023-08-31T16:07:10.000+0200}, address = {Piscataway}, affiliation = {Amrouch, H (Corresponding Author), Univ Stuttgart, Chair Semicond Test & Reliabil STAR, Stuttgart, Germany. Kumar, Shubham; Chatterjee, Swetaki; Thomann, Simon; Genssler, Paul R.; Amrouch, Hussam, Univ Stuttgart, Chair Semicond Test & Reliabil STAR, Stuttgart, Germany. Kumar, Shubham; Chatterjee, Swetaki; Chauhan, Yogesh Singh, Indian Inst Technol Kanpur, Dept Elect Engn, Kanpur, India.}, author = {Kumar, Shubham and Chatterjee, Swetaki and Thomann, Simon and Genßler, Paul R. and Chauhan, Yogesh Singh and Amrouch, Hussam}, biburl = {https://puma.ub.uni-stuttgart.de/bibtex/28887bff9ee4ac6023c8ef4bef5115cdf/puma-wartung}, booktitle = {2022 IFIP/IEEE 30th International Conference on Very Large Scale Integration (VLSI-SoC)}, doi = {10.1109/VLSI-SoC54400.2022.9939626}, eventdate = {2022-10-03/2022-10-05}, eventtitle = {2022 IFIP/IEEE 30th International Conference on Very Large Scale Integration (VLSI-SoC)}, interhash = {4d9235927d2c294a25065277475a0744}, intrahash = {8887bff9ee4ac6023c8ef4bef5115cdf}, isbn = {{978-1-6654-9005-4} and {978-1-6654-9006-1}}, keywords = {}, language = {eng}, publisher = {IEEE}, timestamp = {2023-08-31T14:07:10.000+0200}, title = {Cross-layer FeFET Reliability Modeling for Robust Hyperdimensional Computing}, unique-id = {WOS:000889978800057}, venue = {Patras, Greece}, year = 2022 }